This site uses third-party website tracking technologies to provide and continually improve our services, and to display advertisements according to users' interests. I agree and may revoke or change my consent at any time with effect for the future.
High-stable HF wafer contact
ideal for automated wafer testing
®
Z Probe
High-Frequency Wafer Probe (GS/SG 10 GHz)
A Ground-Signal (GS) conï¬guration is the most cost-effective RF design