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DSAEDA000104899.pdf
Manufacturer
Cascade Microtech
Partial File Text
PA300 300 mm Semi-automatic Probe System DATA SHEET The PA300 is a precise and lexible semi-automatic test solution for wafers and substrates up to 300 mm. It is ideal for failure analysis (FA)
Datasheet Type
Original
ECAD Model
DSAEDA000104899.pdf preview
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