DSA00141253.pdf by National Semiconductor

Partial File Text Using At-Speed BIST to Test LVDS Serializer/Deserializer Function Magnus Eckersand National Semiconductor/Sweden magnus.eckersand@nsc.com Fredrik Franzon Ericsson Radio Systems/Sweden fredrik.fr
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
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circuit Interconnect BIST ETC93 LVDS advantages disadvantages

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