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    DSA00141250.pdf

    • National Semiconductor
    • Partition IEEE 1149.1 SCAN Chains For Manageability! Application Brief 121 Highlights · Partition JTAG Chains to Enhance Targeting, Throughput, and Isolation During JTAG Test · Extend the IEEE
    • Original
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    DSA00141250.pdf preview Download Datasheet

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    corelis JTAG CONNECTOR JTAG CONNECTOR SCANSTA111 SCANSTA112 STA111

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