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Scans-00139330.pdf
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N AMER PHILIPS/DISCRETE Ã7D D H bt^^l DOCHSM? 5 U T~â£)( - GI LID RELIABILITY DATA EB9B 1 'TEST - TEMPERATURE #OF . UNITS UNIT HOURS #OF FAILURES FAILURE RATE* Operating Life Tj= 150°C 1483
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Scan
ECAD Model
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1NL4148
1NL4153
1NL914
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1NLD914B
6666 DIODE
gi diode
MIL-STD-690B
switching diode
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