DSASW00325692.pdf by Pericom Semiconductor

Partial File Text Date: Subject: March 15, 2006 (Update) Hynix CMOS 0.5 m 1P3M Wafer Fab Reliability Report - PI3L301D A total of 134 units successfully completed Dynamic High Temperature Operating Life (DHTOL)
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3CH100 3CH400 a2030 PI3L110 PI3L301D PI3L301DA