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DSAIH000136097.pdf
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Partial File Text
SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223-- 0 3 6 4 1 , JUNE 1990 Members of Texas Instruments SCOPETM Family of Testability Products Octal Test
Datasheet Type
Scan
ECAD Model
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User Tagged Keywords
74BCT8374
D3641
TEX-E wire