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DSA00326073.pdf
Manufacturer
National Semiconductor
Partial File Text
Table of Contents 1 0 INTRODUCTION 2 0 PHILOSOPHY 3 0 BUILT-IN TEST FEATURES 3 1 Sync between DUT and Tester 3 2 Internal Logic Test 3 3 RAM Test 3 4 ROM Dump This note will provide some ins
Datasheet Type
Original
ECAD Model
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