DSASW00296628.pdf

Partial File Text Drop Test Reliability of Wafer Level Chip Scale Packages Mikko Alajoki, Luu Nguyen(* and Jorma Kivilahti Lab. of Electronics Production Technology Helsinki University of Technology P.O.Box 3000, 0
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

DSASW00296628.pdf preview

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