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    • Texas Instruments
    • SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal
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    • Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.
      SN74BCT8373ANT SN74BCT8373ANTE4 SN54BCT8373JT SN74BCT8373ANT SN74BCT8373NT
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