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DSA00421985.pdf
Manufacturer
Altera
Partial File Text
3. Configuration & Testing SIIGX51005-1.3 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix® II GX devices provide Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry tha
Datasheet Type
Original
ECAD Model
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