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Scans-0088960.pdf
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SDLSQ89 ] I ⢠Dependable Texas Instruments Quality and ' Reliability description These devices contain three independent 3-input IMOR gates. The SN5427 and SN54LS27 are characterized for op
Datasheet Type
Scan
RoHS
No
Pb Free
Unknown
Lifecycle
Obsolete
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User Tagged Keywords
SN5427
SN54LS27
SN7427
SN74LS27