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DSA00151979.pdf
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Partial File Text
Reliability Testing for LDMOS Devices used in Xemod QuikPAC Power Modules Standard Tests The LDMOS devices used in QuikPAC modules have successfully passed the tests listed below. DC Burn-In MIL
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Original
ECAD Model
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User Tagged Keywords
A112-A
AN-003
AN003
MIL-STD-883 Method 3015.7