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Partial File Text ï»¿IEEE BCTM 6.1 Improved Extraction of Base and Emitter Resistance from Small Signal High Frequency Admittance Measurements W.J: Kloosterman, J.C.J. Paasschens and D.B.M. Klaassen Philips Research
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gummel IC sequential DATA BASE small signal high frequency bipolar transistor transistor RBV Y parameters of transistors in high frequency

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