DSA00816465.pdf by Texas Instruments

Partial File Text SN74LVTH18646AEP, SN74LVTH182646AEP 3.3V ABT SCAN TEST DEVICES WITH 18BIT TRANSCEIVERS AND REGISTERS SCAS745 - DECEMBER 2003 D Controlled Baseline D D D D D D D - One Assembly/Test Site, One Fabr
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