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    DASF0041602.pdf

    • Micrel Semiconductor
    • RELIABILITY REPORT DATE: 4/28/2004 QUALITY ENG : Herb Grimm PURPOSE: Matte Tin Reliability Test Summary. HTOL - High Temperature Operating Life Test TA= + 125°C PACKAGE TYPE : PART N
    • Original
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    DASF0041602.pdf preview Download Datasheet

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    20L SOT-23 3a204 MIC2171WU MIC2177YWM MIC29151BU MIC29151WU Preconditioning UNISEM

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