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DSASW00223129.pdf
Manufacturer
Lattice Semiconductor
Partial File Text
LatticeECP2/M Soft Error Detection (SED) Usage Guide April 2010 Technical Note TN1113 Introduction Soft errors occur when high-energy charged particles alter the stored charge in a memory cel
Datasheet Type
Original
ECAD Model
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crc verilog code 16 bit
error detection code in vhdl
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