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DSA0022824.pdf
Manufacturer
Texas Instruments
Partial File Text
SLWA036 JUNE 2004 A Standardized Procedure for the Direct Measurement of Sub-Picosecond RMS jitter in High-Speed Analog-to-Digital Converters Ioannis Papantonopoulos and Alfio Zanchi Texas In
Datasheet Type
Original
ECAD Model
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ADS5420
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