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DSA00507473.pdf
Manufacturer
Harris Semiconductor
Partial File Text
S E M I C O N D U C T O R RR002 Intelligent Power Products Reliability Report April 1992 CONCURRENT DESIGN, TEST AND RELIABILITY ENGINEERING OF POWER ASICs By Erwin A. Herr Introduct
Datasheet Type
Original
ECAD Model
Part Details
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User Tagged Keywords
Harris catalogue
ISSN-0018-9529
Reliability Test Methods for Packaged Devices
Surface mount NPN/PNP complementary transistor
Thermal Test-Element-Group
transistors mos
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