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DSAZIHA2X000110917.pdf
Manufacturer
Protek Devices
Partial File Text
MIL PROCESSING TEST PLAN FOR DLZ SERIES â H1 VERSIONS (Bidirectional) TEST CONDITION Internal Visual MIL-STD-750 TEST METHOD 2072 Storage TA = +150°C for 24 hours 1032 Te
Datasheet Type
Original
ECAD Model
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DSAZIHA2X000110917.pdf preview
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