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DSA00141253.pdf
Manufacturer
National Semiconductor
Partial File Text
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function Magnus Eckersand National Semiconductor/Sweden magnus.eckersand@nsc.com Fredrik Franzon Ericsson Radio Systems/Sweden fredrik.fr
Type
Original
ECAD Model
Part Details
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DSA00141253.pdf preview
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User Tagged Keywords
circuit Interconnect BIST
ETC93
LVDS advantages disadvantages
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