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DSAIH00017379.pdf
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RadHard Field Programmable Gate Arrays F e a ftw s re s Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High D oseR ateS urvivability Latch-Up Im m unity Guaranteed Q
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ECAD Model
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BSC 25-05
h128 transistor
NH FUSE LINDER
quivalent book
transistors H128