MIL-STD 833 test method 3015

Abstract: MP 1008 es
Contextual Info: Timer E 2 1024K Electrically Erasable PR O M Technology, Incorporated P R E L IM IN A R Y D A T A S H E E T FEATURES • High Speed • 120 nsec Maximum Access Time ■ Low Power CMOS Technology • 70 mA Active Current • 8 mA Standby Current ■ High Endurance

Contextual Info: Technology, Incorporated Timer E 2 1024K Electrically Erasable PRO M PRELIMINARY DATASHEET FEATURES • High Speed • 120 nsec Maximum Access Time High Endurance • tO,000 Cycles/Byte • 10 Year Data Retention ■ Low Power CMOS Technology • 70 mA Active Current