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    2a92

    Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 2a92 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9 PDF

    5A9516

    Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 5A9516 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126 PDF

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original
    AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906 PDF

    2a92

    Abstract: 3B9335 3C9343 AT29C010 32PDIP
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-29C010 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original
    AT-29C010 AT-29C010 3A0946-2 3A1195 3C0337 3D0897 3C0714 4A0088 4A1536 4A1990 2a92 3B9335 3C9343 AT29C010 32PDIP PDF

    29C256

    Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MIL-M-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 report on PLCC tsop 6 3A0081 PDF

    28C64 EEPROM

    Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST


    Original
    AT-28C64 AT-28C64 187-3B 133317B2 232510B-2 3A0781 3A0782B1 4B1973 4D1971 4D1971-2 28C64 EEPROM eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616 PDF

    29C256

    Abstract: 29C257 PLCC 64
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MILM-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 PLCC 64 PDF