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    NEC 1357

    Abstract: B001 DIP SWITCH AAD3820A AAAD820A
    Text: CB-C7 FAMILY CELL-BASED IC PRELIMINARY ANALOG MACRO COMMON 1993 Document No. IEU-1357 (O. D. No. IEU-839) Data Published August 1993P Printed in Japan NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide


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    IEU-1357 IEU-839) 1993P 304-pin 68-pin 84-pin 72-pin 132-pin 176-pin 208-pin NEC 1357 B001 DIP SWITCH AAD3820A AAAD820A PDF