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    SCANPSC110F

    Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
    Text: General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a


    Original     		PDF SCANPSC110F 32-bit cou85 ds011570 SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX

    M28B

    Abstract: MS-013 SCANPSC110F SCANPSC110FSC
    Text: Revised August 2000 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan


    Original     		PDF SCANPSC110F IEEE1149 SCANPSC110F M28B MS-013 SCANPSC110FSC

    SCANPSC110FFMQB

    Abstract: PSC11 SCANPSC110F SCANPSC110FDMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
    Text: + / March 1998 P A IF ?C H II_ D SEMICONDUCTOR i SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description Features The SC ANPSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­


    OCR Scan     		PDF SCANPSC110F IEEE1149 SCANPSC110F 28-Lead 28-Pin WA28D ds011570 SCANPSC110FFMQB PSC11 SCANPSC110FDMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX

    Untitled

    Abstract: No abstract text available
    Text: S E M IC O N D U C T O R tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­


    OCR Scan     		PDF SCANPSC110F IEEE1149 28-Lead WA28D ds011570

    16 BIT SHIFT REGISTER

    Abstract: PSC11
    Text: I R C H I L D SEMICONDUCTOR tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop te st bus environm ent. The advan­


    OCR Scan     		PDF SCANPSC110F IEEE1149 ds011570 16 BIT SHIFT REGISTER PSC11