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    EASY320

    Abstract: siemens cpu 216 ADSQ GALI6V8 sfw 10,7 MHz MFL-260 S0828
    Text: PEB 20320 SIEMENS Application Notes 5 Application Notes 5.1 Test Loops 5.1.1 Test Loop Definitions for the MUNICH32 Two basic types of test loops are provided by the MUNICH32, internal and external. Each of these types is further subdivided into channelwise and complete test loops thus


    OCR Scan     		MUNICH32 MUNICH32, MUNICH32 EASY320 siemens cpu 216 ADSQ GALI6V8 sfw 10,7 MHz MFL-260 S0828 PDF

    c5088 transistor

    Abstract: transistor C3207 TLO84CN sec c5088 IN5355B D2817A C3207 transistor toshiba f630 TLO81CP MC74HC533N
    Text: Transistor - Diode Cross Reference - H.P. Part Numbers to JEDEC Numbers Part Num. 1820-0225 1820-0240 1820-0352 1820-1804 1821-0001 1821-0002 1821-0006 1850-0062 1850-0064 1850-0075 1850-0076 1850-0093 1850-0099 1850-0126 1850-0137 1850-0150 1850-0151 1850-0154


    Original     		1853IMPATT c5088 transistor transistor C3207 TLO84CN sec c5088 IN5355B D2817A C3207 transistor toshiba f630 TLO81CP MC74HC533N PDF