JESD22-B102-C
Abstract: SOT-86 sot86 transistor c 5586 q404 transistor SGA-6486Z SGA-6286 JESD22-B102C q402 transistor transistor 5586
Text: Reliability Report SGA/SGC Series in SOT-86 Package SnPb Plated SGA-2186 SGA-2286 SGA-2386 SGA-2486 SGA-3286 SGA-3386 SGA-3486 SGA-3586 SGA-4186 SGA-4286 SGA-4386 SGA-4486 SGA-4586 SGA-5286 SGA-5386 SGA-5486 SGA-5586 SGA-6286 SGA-6386 SGA-6486 Matte Sn, RoHS Compliant
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OT-86
SGA-2186
SGA-2286
SGA-2386
SGA-2486
SGA-3286
SGA-3386
SGA-3486
SGA-3586
SGA-4186
JESD22-B102-C
SOT-86
sot86
transistor c 5586
q404 transistor
SGA-6486Z
SGA-6286
JESD22-B102C
q402 transistor
transistor 5586
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ESD test plan
Abstract: CGA-0116 0116 led JESD22-A103 1100C JESD22-A114 RQR-103796 1500C
Text: Reliability Conditional Qualification Report CGA-0116 303 S. Technology Ct, Broomfield CO, 80021 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103796 Rev A 1 CGA-0116 Reliability Qualification Report I. Qualification Overview The CGA-0116 family of products has demonstrated reliable operation by passing all
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CGA-0116
RQR-103796
CGA-0116
195oC.
CGA-0116.
ESD test plan
0116 led
JESD22-A103
1100C
JESD22-A114
1500C
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SBW5089
Abstract: JESD22-A110 sirenza microdevice sot-89 TRANSISTOR a105 JESD22-A113 JESD22-A114 SBA-4089 SBA-5089 SBF-4089 SBF-5089
Text: Reliability Qualification Report SBA-5089 Products Qualified by Similarity SBA-4089 SBF-5089 SBF-4089 Initial Qualification 303 S. Technology Ct, Broomfield CO, 80021 SBW-5089 7-2003 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103306- Rev. D
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SBA-5089
SBA-4089
SBF-5089
SBF-4089
SBW-5089
RQR-103306-
SBA-5089
SBA-5089BA-5089,
SBW5089
JESD22-A110
sirenza microdevice sot-89
TRANSISTOR a105
JESD22-A113
JESD22-A114
SBA-4089
SBF-4089
SBF-5089
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S510068-28Z
Abstract: s5100 JESD22-A104B JESD22-A108B JESD22-A114 JESD78
Text: Reliability Qualification Report S510068-28Z - RoHS Compliant Products Qualified by Similarity S510069-28Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall
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S510068-28Z
S510069-28Z
RQR-105559
S510068-28Z
S510069-28Z
s5100
JESD22-A104B
JESD22-A108B
JESD22-A114
JESD78
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STQ2016Z
Abstract: JESD22-A104B SRF-2016Z JESD22-A110 SRF-1016Z SRQ-2116Z STQ-1016Z STQ-2016Z STQ-3016Z TSSOP-16
Text: Reliability Qualification Report STQ-2016Z - Matte Sn, RoHS compliant Products Qualified by Similarity STQ-1016Z SRF-1016Z SRQ-2116Z STQ-3016Z SRF-2016Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for
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STQ-2016Z
STQ-1016Z
SRF-1016Z
SRQ-2116Z
STQ-3016Z
SRF-2016Z
RQR-104756
SRQ-2116Z,
STQ2016Z
JESD22-A104B
SRF-2016Z
JESD22-A110
SRQ-2116Z
TSSOP-16
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JESD22-A102C
Abstract: JESD22-A104B SGB-6433Z SGB-4533Z SGB-6533 SGB-2233Z JESD22-A-104B JESD22-A113C SGB-6433 SGB-6533Z
Text: Reliability Qualification Report SGB-6533 - SnPb Plated SGB-6533Z - Matte Sn, RoHS Compliant Products Qualified by Similarity SGB-2233 SGB-2433 SGB-2233Z SGB2433Z SGB-4333 SGB-4533 SGB-6433 SGB-4333Z SGB-4533Z SGB-6433Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for
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SGB-6533
SGB-6533Z
SGB-2233
SGB-2433
SGB-2233Z
SGB2433Z
SGB-4333
SGB-4533
SGB-6433
SGB-4333Z
JESD22-A102C
JESD22-A104B
SGB-6433Z
SGB-4533Z
JESD22-A-104B
JESD22-A113C
SGB-6433
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SBB-2089Z
Abstract: sbb2089z SBB5089 SBB-4089 darlington pair transistor SBB-2089 SBB-3089 SBB2089 SBB-1089 SBB5089Z
Text: Reliability Qualification Report SBB-2089Z Products Qualified by Similarity SBB-1089 SBB-1089Z SBB-3089Z SBB-4089Z SBB-5089Z CGB-1089Z SBB-2089 SBB-4089 SBB-5089 Initial Qualification Feb 2005 Additional HAST June 2005 The information provided herein is believed to be reliable at press time. RFMD assumes no responsibility for inaccuracies or omissions.
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SBB-2089Z
SBB-1089
SBB-1089Z
SBB-3089Z
SBB-4089Z
SBB-5089Z
CGB-1089Z
SBB-2089
SBB-4089
SBB-5089
SBB-2089Z
sbb2089z
SBB5089
SBB-4089
darlington pair transistor
SBB-2089
SBB-3089
SBB2089
SBB-1089
SBB5089Z
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SPF-5043Z
Abstract: spf5043z spf-5043 5043Z SPF 5043Z JESD22-A104B JESD22-A108B JESD22-A114 JESD22-A-108-B SOT343 lna
Text: Reliability Qualification Report SPF-5043Z - Matte Sn, RoHS Compliant The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall
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SPF-5043Z
RQR-105880
SPF-5043Z
SPF-50
JESD22-A103B
JESD22-B102C
spf5043z
spf-5043
5043Z
SPF 5043Z
JESD22-A104B
JESD22-A108B
JESD22-A114
JESD22-A-108-B
SOT343 lna
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SPF-5122Z
Abstract: spf-5122 SPF5122z precondition DIP JEDEC spf 5122 JESD22-A104B JESD22-A108B JESD22-A114 ESD test plan JESD22-B102C
Text: Reliability Qualification Report SPF-5122Z - Matte Sn, RoHS Compliant The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall
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SPF-5122Z
RQR-105879
SPF-5122Z
SPF-51
JESD22-A103B
Sn63/Pb37
JESD22-B102C
spf-5122
SPF5122z
precondition DIP JEDEC
spf 5122
JESD22-A104B
JESD22-A108B
JESD22-A114
ESD test plan
JESD22-B102C
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SGA6489Z
Abstract: IC 7489 JESD22-B102-C SGA6389Z SGA-5589Z SGA-7489 SGA-6489 SGA-9289Z SGA9189Z SGC-6489
Text: Reliability Report SGA/SGC Series in SOT-89 Package SnPb Plated SGA-5289 SGA-5389 SGA-5489 SGA-5589 SGA-6289 SGA-6389 SGA-6489 SGA-6589 SGA-7489 SGA-9089 SGA-9189 SGA-9289 Matte Sn, RoHS Compliant SGA-5289Z SGA-5389Z SGA-5489Z SGA-5589Z SGA-6289Z SGA-6389Z
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OT-89
SGA-5289
SGA-5389
SGA-5489
SGA-5589
SGA-6289
SGA-6389
SGA-6489
SGA-6589
SGA-7489
SGA6489Z
IC 7489
JESD22-B102-C
SGA6389Z
SGA-5589Z
SGA-7489
SGA-6489
SGA-9289Z
SGA9189Z
SGC-6489
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JESD22-A110-B HIGHLY ACCELERATED TEMPERATURE AND
Abstract: No abstract text available
Text: V•I Chip – BCM Bus Converter Module TM B048K480T30 + + –K – • >97% efficiency • 300 Watt 450 Watt for 1 ms • 125°C operation • High density – up to 1165 W/in3 • <1 µs transient response • Small footprint – 280 W/in • >3.5 million hours MTBF
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B048K480T30
P/N27688
07/04/10M
JESD22-A110-B HIGHLY ACCELERATED TEMPERATURE AND
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transistor af 126
Abstract: JESD22-B-107-A J-STD-029 mount chip transistor 332
Text: V•I Chip – BCM Bus Converter Module TM B048K120T20 Vin = 42 - 53 V Vout = 10.5 - 13.25 V Iout = 17.0 A K = 1/4 Rout = 25 mΩ max • 48V to 12V V•I Chip Converter • >96% efficiency • 200 Watt 300 Watt for 1 mS • 125°C operation • High density – up to 800 W/in3
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B048K120T20
7/03/10M
transistor af 126
JESD22-B-107-A
J-STD-029
mount chip transistor 332
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JESD22-A108
Abstract: JESD22*108
Text: AOS Semiconductor Product Reliability Report AO3421E, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3421E. Accelerated environmental tests are performed on a specific sample size, and then followed
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AO3421E,
AO3421E.
AO3421E
Resul77x168
6x77x1000)
JESD22-A108
JESD22*108
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PPAP level submission requirement table
Abstract: PPAP MANUAL for automotive industry foundry metals quality MANUALS result of 200 prize bond INCOMING MATERIAL INSPECTION checklist, PCB TSMC 90nm sram SMD a006 ISO 9001 Sony foundry INCOMING MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION procedure
Text: Contents Contents i Chapter 1 Quality Management 1.1 Quality Policy 1.2 Quality Organization 1.3 ISO 9001 Year 2000 Revision 1.4 Quality Systems 1.4.1 Process Map 1.4.2 Advanced Product Quality Planning 1.4.3 Quality Assurance in the Project Approval Stage
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JESD22-A-103A
Abstract: jesd22-a-104B JESD22 A-102 JESD22-A-101 JESD22-B-107-A converter 48 to 24 switching
Text: PRELIMINARY V•I Chip Bus Converter Module BCM V•I Chip – BCM Bus Converter Module TM B048K480T30 K indicates BGA configuration. For other mounting options see Part Numbering below. • 48 V to 48 V V•I Chip Converter • Typical efficiency 96% • 300 Watt 450 Watt for 1 ms
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B048K480T30
JESD22-A-103A
jesd22-a-104B
JESD22 A-102
JESD22-A-101
JESD22-B-107-A
converter 48 to 24 switching
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Untitled
Abstract: No abstract text available
Text: Product Qualification Package CGD1042H 1 GHz, 23 dB Gain high output power doubler Rev. 01 — November 30, 2009 Document information Info Content Keywords Product Qualification Package Abstract This document presents the characteristics of CGD1042H power doubler
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CGD1042H
CGD1042H
CGD10
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48V-to-12V
Abstract: smd TRANSISTOR marking T1
Text: V•I Chip – BCM Bus Converter Module TM B048K120T15 Vin = 42 - 53 V Vout = 10.5 - 13.25 V Iout = 12.5 A K = 1/4 Rout = 32 mΩ max • 48V to 12V V•I Chip Converter • >96% efficiency • 150 Watt 225 Watt for 1 ms • 125°C operation • High density – up to 600 W/in3
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B048K120T15
11/03/10M
48V-to-12V
smd TRANSISTOR marking T1
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Untitled
Abstract: No abstract text available
Text: Product Qualification Package CGY888C 34 dB, 870 MHz GaAs push-pull forward amplifier Rev. 02 — December 29, 2009 Document information Info Content Keywords Product Qualification Package Abstract This document presents the characteristics of CGY888C push pull CATV
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CGY888C
CGY888C
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IPC 9701
Abstract: transistor marking JB
Text: BCM V•I Chip – BCM Bus Converter Module TM B048K480T30 K indicates BGA configuration. For other mounting options see Part Numbering below. • 48 V to 48 V V•I Chip Converter • >97% efficiency • 300 Watt 450 Watt for 1 ms • 125°C operation + +
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B048K480T30
P/N27688
10/04/10M
IPC 9701
transistor marking JB
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Untitled
Abstract: No abstract text available
Text: Qualification and Reliability Report Series: EQTB73 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature
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EQTB73
JESD22-A102,
MIL-STD-883,
UL94-V0
TEN01-100-318
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Untitled
Abstract: No abstract text available
Text: Qualification and Reliability Report Series: EQVD13 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature
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EQVD13
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Untitled
Abstract: No abstract text available
Text: Qualification and Reliability Report Series: EH56 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature
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Calc125Â
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JESD22-B116
Abstract: MIL-STD-883 method 2019 JESD22-A110 MIL-STD-883 PRESSURE JESD22A110
Text: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN 7/31/2000 PCN #: L0007-04 DATE: Product Affected: 74LVC16244, 74LVC16245 74LVCH162244 Manufacturing Location Affected: IDT Salinas Fab Date Effective:
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L0007-04
74LVC16244,
74LVC16245
74LVCH162244
L0007-04
QLG-00-07
74LVC16245
EIA/JESD22-B116
Mil-Std-883,
JESD22-B116
MIL-STD-883 method 2019
JESD22-A110
MIL-STD-883 PRESSURE
JESD22A110
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Untitled
Abstract: No abstract text available
Text: Qualification and Reliability Report Series: E13C5 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature
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E13C5
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