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    Untitled

    Abstract: No abstract text available
    Text: 37E D - M303371 0GB5R3» •. «HAS HARRIS SEMICONS SECTOR Burn-In Test-Circuit Connections Static CD54HC/HCT241 Dynamic CD54HC/HCT241 -p s 2 -0 7 CD54HC241/3A T 'S i- S l CD54HCT241/3A Use Static II for /3A burn-in and Dynamic tor Life Test. STATIC BURN-IN 1


    OCR Scan     		PDF M303371 CD54HC/HCT241 CD54HC241/3A CD54HCT241/3A 2k-47k 54HCT

    m3033

    Abstract: No abstract text available
    Text: 37E » • 4305271 OGaSTâb 0 IH AS .Hlgh-Reliability High-Speed CMOS Logic IÇs HARRIS SEHÏC0ND SECTOR Switching Sp@€d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = SO pF, Input t, t, = 6 ns) 25° C CHARACTERISTIC SYMBOL


    OCR Scan     		PDF CD54HC240/3Â CD54HCT240/3A 15way m3033