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    UPC2712B

    Abstract: UPB1509B upc2709b NE85608-L NE68108 NE73408 UPB1508B NE85608 NE41607 NE02103
    Text: G E T -3 0 6 9 8 Rev.F Specification Control D raw ing G rade L Devices For S p ace Application = H i-R e l P rep ared on NEC Com pound S ilic o n D ev ic e = : D ec e m b er 1 6 , 2 0 0 2 S e m ic o n d u c to r D evices, Ltd. 1 /3 7 G E T -3 0 6 9 8 Rev.E


    OCR Scan     		GET-30698 NE89400 UPB584B 10Cycies Page31 NE02100 Page35/37 UPC1677P 1678P UPC2712B UPB1509B upc2709b NE85608-L NE68108 NE73408 UPB1508B NE85608 NE41607 NE02103 PDF

    NE85608

    Abstract: NE856XX 336H NE681XX
    Text: Qualification Test Report on NE681XX Prepared on by :April, 19, 1996 : K,/ KAZUO YAMANAKA Assistant Manager Approved by : <A ' l t •ab tMASANORI t MATSUO' Manager ,Engineering Reliability ¿Quality Control Department Compound Semiconductor Device Division


    OCR Scan     		NE681XX NE681XX NE856XX. NE856XX NE681XX. NE85608. 2000Hrs) NE85608 336H PDF