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Inolux IN-PI42TASPRPGPB ADDRESS LED DISCRETE SERIAL RGB
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	IN-PI42TASPRPGPB	Reel	33,000		1,500	1 - 10 - 100 - 1000 - 10000 $0.226	Buy Now
Mouser Electronics	IN-PI42TASPRPGPB		41,194			1 $0.72 10 $0.469 100 $0.307 1000 $0.302 10000 $0.214	Buy Now
TME	IN-PI42TASPRPGPB		1,102		1	1 $0.7 10 $0.53 100 $0.299 1000 $0.24 10000 $0.219	Buy Now
onsemi MC78L24ACPRPG IC REG LINEAR 24V 100MA TO92-3
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	MC78L24ACPRPG	Cut Tape	24,977		1	1 $0.75 10 $0.449 100 $0.2812 1000 $0.18793 10000 $0.18793	Buy Now
	MC78L24ACPRPG	Ammo Pack	24,000		2,000	1 - 10 - 100 - 1000 - 10000 $0.1361	Buy Now
Avnet Americas	MC78L24ACPRPG	Ammo Pack		13 Weeks	6,000	1 - 10 - 100 - 1000 - 10000 $0.10721	Buy Now
Newark	MC78L24ACPRPG	Reel			2,000	1 $0.198 10 $0.198 100 $0.198 1000 $0.198 10000 $0.163	Buy Now
Avnet Silica	MC78L24ACPRPG			14 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now
EBV Elektronik	MC78L24ACPRPG			15 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now

Flip Electronics	MC78L24ACPRPG		1,170			1 - 10 - 100 - 1000 - 10000 -	Get Quote
onsemi MC79L12ACPRPG IC REG LINEAR -12V 100MA TO92-3
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	MC79L12ACPRPG	Cut Tape	5,943		1	1 $0.62 10 $0.37 100 $0.2295 1000 $0.15154 10000 $0.15154	Buy Now
	MC79L12ACPRPG	Ammo Pack	4,000		2,000	1 - 10 - 100 - 1000 - 10000 $0.1082	Buy Now
Newark	MC79L12ACPRPG	Bulk	3,754		5	1 $0.59 10 $0.315 100 $0.183 1000 $0.161 10000 $0.124	Buy Now
Avnet Silica	MC79L12ACPRPG			11 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now
EBV Elektronik	MC79L12ACPRPG			12 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now
onsemi MC78L18ACPRPG IC REG LINEAR 18V 100MA TO92-3
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	MC78L18ACPRPG	Ammo Pack	2,000		2,000	1 - 10 - 100 - 1000 - 10000 $0.11713	Buy Now
Avnet Americas	MC78L18ACPRPG	Ammo Pack		13 Weeks	8,000	1 - 10 - 100 - 1000 - 10000 $0.10893	Buy Now
Newark	MC78L18ACPRPG	Bulk			2,000	1 - 10 - 100 - 1000 $0.131 10000 $0.104	Buy Now
Rochester Electronics	MC78L18ACPRPG		441		1	1 $0.1129 10 $0.1129 100 $0.1061 1000 $0.096 10000 $0.096	Buy Now
TME	MC78L18ACPRPG				1	1 $0.271 10 $0.196 100 $0.156 1000 $0.122 10000 $0.122	Get Quote

Avnet Silica	MC78L18ACPRPG			14 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now
onsemi MC78L15ABPRPG IC REG LINEAR 15V 100MA TO92-3
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	MC78L15ABPRPG	Cut Tape	1,998		1	1 $1.18 10 $0.721 100 $0.4623 1000 $0.31862 10000 $0.31862	Buy Now
Avnet Americas	MC78L15ABPRPG	Ammo Pack		13 Weeks	6,000	1 - 10 - 100 - 1000 - 10000 $0.20921	Buy Now
Newark	MC78L15ABPRPG	Bulk			2,000	1 - 10 - 100 - 1000 $0.305 10000 $0.239	Buy Now
TME	MC78L15ABPRPG				1	1 $0.786 10 $0.546 100 $0.365 1000 $0.327 10000 $0.327	Get Quote
Avnet Silica	MC78L15ABPRPG			14 Weeks	2,000	1 - 10 - 100 - 1000 - 10000 -	Buy Now

Flip Electronics	MC78L15ABPRPG		10,349			1 - 10 - 100 - 1000 - 10000 -	Get Quote

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PRPG Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
BCT8373A Abstract: No abstract text available Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE	Original	SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A	PDF
Untitled Abstract: No abstract text available Text: SN74LVTH18502AĆEP, SN74LVTH182502AĆEP 3.3ĆV ABT SCAN TEST DEVICES WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS SCAS744A − DECEMBER 2003 − REVISED JUNE 2004 D Controlled Baseline D D D D D D D D UBT  Universal Bus Transceiver − One Assembly/Test Site, One Fabrication	Original	SN74LVTH18502AEP, SN74LVTH182502AEP 18BIT SCAS744A	PDF
Untitled Abstract: No abstract text available Text: SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D Compatible With the IEEE Standard SN54ABT8646 . . . JT PACKAGE	Original	SN54ABT8646, SN74ABT8646 SCBS123F ABT646 SN54ABT8646 SN74ABT8646	PDF
BCT245 Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE	Original	SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A BCT245 F245 SN54BCT8245A SN74BCT8245A	PDF
V5050 Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This	Original	SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17customer V5050 BCT244 F244 SN54BCT8244A SN74BCT8244A	PDF
LVT18512 Abstract: No abstract text available Text: SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 – OCTOBER 1997 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments	Original	SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 18-BIT SCBS711 LVT182512 LVT18512	PDF
Untitled Abstract: No abstract text available Text: SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3ĆV ABT SCAN TEST DEVICES WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS SCBS668C − JULY 1996 − REVISED JUNE 2004 D Members of the Texas Instruments D D D D D D SCOPE  Family of Testability Products	Original	SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A SCBS668C	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A	PDF
Untitled Abstract: No abstract text available Text: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products	Original	SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A 18-BIT SCBS166D ABTH182646A	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE	Original	SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A	PDF
LVTH18514 Abstract: LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc Text: SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments TI SCOPE  Family of Testability Products	Original	SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 20-BIT SCBS670C LVTH18514 LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc	PDF
Untitled Abstract: No abstract text available Text: SN54ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS SGBS306 – AUGUST 1992 – REVISED AUGUST 1994 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus  Family	Original	SN54ABT18646 18-BIT SGBS306 5962-9469801QXA SNJ54ABT18646HV 5962View 9469801QXA	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE	Original	SN54BCT8245A, SN74BCT8245A SCBS043E BCT245	PDF
Untitled Abstract: No abstract text available Text: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products	Original	SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A 18-BIT SCBS164E ABTH182502A 5962-9561401QXA SNJ54ABTH18502AHV 5962View	PDF

Untitled Abstract: No abstract text available Text: fc>6 18 wa W23C4096 IVinbond 512K X 8 CMOS MASK ROM GENERAL DESCRIPTION FEATURES Active: lOOmW typ. The W23C4096 is a high speed, low power mask-prpgrammable read-only memory organ Standby: 25¿¿W(typ.) ized as 524288X8 bits • Low power consumption:	OCR Scan	W23C4096 W23C4096 524288X8 B-1930-Zaventem	PDF
a1310a Abstract: No abstract text available Text: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS _ _ SCBS165A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments	OCR Scan	SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A 20-BIT SCBS165A-AUGUST ABTH182504A a1310a	PDF
74ABTH18646A Abstract: No abstract text available Text: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O	OCR Scan	SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A 18-BIT SCBS166D ABTH182646A 25-i2 74ABTH18646A	PDF
Untitled Abstract: No abstract text available Text: CASE FINISH CURRENT AMPS SOLDER WORKING VOLTAGE -5 5 X TO +85T AC MAXIMUM DC RESISTANCE (OHMS) -5S C 10 +12SC DC AC DC 100 3.0 150 MAXIMUM VOLTAGE DROP DC AC .18 16 41 PART MARKING: 5 1 -3 1 1 -3 2 1 SCI DATE CODE •050X.070 Slot (2X) -[1.27X1.77] ò .758 MAX ▼	OCR Scan	IL-STD-220, 28UNF--	PDF
Untitled Abstract: No abstract text available Text: CASE FINISH CURRENT AMPS SOLDER 0.5 WORKING VOLTAGE -5 5 X TO +85T AC DC 200 AC DC 125 150 PART MARKING: cn 5 1 -3 1 1 -3 1 5 DATE CODE MAXIMUM VOLTAGE DROP MAXIMUM DC RESISTANCE (OHMS) -5S C 10 +12SC DC AC MINIMUM CAPACITANCE (uF) MIN. INSERTION LOSS PER M IL-STD-220,	OCR Scan	IL-STD-220, 28UNF--	PDF
samsung NAND FSR Abstract: 29cd16 NAND IC s CIRCUIT DIAGRAM OF 15 INCH SAMSUNG MONITOR 264Byte Text: KM29N16000 2M x 8 Bit NAND Flash Memory SEMICONDUCTOR PRELIMINARY- June 1994 FEATURES GENERAL DESCRIPTION • Single 5 - volt Supply • Organization - Memory Cell Array : 2M +64K x 8 - Data Register : (258 + 8) x 8 • Automatic Program and Erase - Page Program : (256 + 8)Byte	OCR Scan	KM29N16000 KM29N16000 -TSOP2-400F -TSOP2-400R samsung NAND FSR 29cd16 NAND IC s CIRCUIT DIAGRAM OF 15 INCH SAMSUNG MONITOR 264Byte	PDF
TTL 7474 Abstract: 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 SN74ABT8245 tms 3534 Text: SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124A - A UGUS T 1992 - REVI SED AUGUS T 1993 ' Members of the Texas Instruments SCOPE Family of Testability Products 1 Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port	OCR Scan	SN54ABT8245, SN74ABT8245 SCBS124A-AUGUST SN54/74F245 SN54/74ABT245 GCH74flb TTL 7474 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 tms 3534	PDF
SN54ABT18502 Abstract: H TR 1A60 texas instruments 486 TR 1A60 Text: SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C - AU G U S T 1992 - RE V IS E D AU G U S T 1994 SCOPE Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With	OCR Scan	SN54ABT18502 18-BIT SCBS109C H TR 1A60 texas instruments 486 TR 1A60	PDF
KVT 20 Temperature Abstract: SN54ABTH182504A SN54ABTH18504A SN74ABTH182504A SN74ABTH18504A Text: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS - S C B S 1 6 5 A - AU G U S T 1993 - REVISED AU G U S T 1994 ' Members of the Texas Instruments	OCR Scan	SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A 20-BIT --------SCBS165A- ABTH182504A KVT 20 Temperature SN54ABTH182504A SN54ABTH18504A SN74ABTH182504A SN74ABTH18504A	PDF
SN54ABT8652 Abstract: SN74ABT8652 Text: SN54ABT8652, SN74ABT8652 « SCAN TEST d e v ic e s WITH OCTAL BUS TRANSCEIVERS AND REGISTERS - _ • Members of the Texas Instruments SCOPE Family of Testability Products • Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and	OCR Scan	sn54abt8652, sn74abt8652 ------SCBS122D SN54ABT8652 SN54/74F652 SN54/74ABT652 ci75cu SN54ABT8652 SN74ABT8652	PDF

PRPG Search Results

PRPG Price and Stock

Inolux IN-PI42TASPRPGPB

onsemi MC78L24ACPRPG

onsemi MC79L12ACPRPG

onsemi MC78L18ACPRPG

onsemi MC78L15ABPRPG

PRPG Datasheets Context Search

BCT8373A

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BCT245

V5050

LVT18512

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LVTH18514

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a1310a

74ABTH18646A

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samsung NAND FSR

TTL 7474

SN54ABT18502

KVT 20 Temperature

SN54ABT8652