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    RELIABILITY REPORT FORMAT Search Results

    RELIABILITY REPORT FORMAT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    0805HT-8N2TKSC Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    H0402CS-27NXGLW Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    WB1-1TSSD Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    0402CS-36NXJAW Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    WB1-1TSSB Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy

    RELIABILITY REPORT FORMAT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    68hc26

    Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
    Text: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1


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    MAX6809

    Abstract: ST 9727 st 9635 st 9548 12x12 bga thermal resistance MAX232CWE 9846B MAX232 integrated chips 9836 maxim iso 9717
    Text: November 1999 Surface-Mount Devices Reliability Report This report presents reliability data for Maxim’s surface-mount devices, including the results of extensive reliability stress tests performed solely on epoxy surface-mount packages since 1995. Maxim’s surface-mount packages are subjected to standard


    Original     		PDF 1-888-MAXIM-IC MAX6809 ST 9727 st 9635 st 9548 12x12 bga thermal resistance MAX232CWE 9846B MAX232 integrated chips 9836 maxim iso 9717

    68hc11pa8

    Abstract: 68hc11kg4 68B09E 68HC11PH8 HC711KG4 68HC11KA4 68HC57 68HC11L6 HC705B16 motorola 68hc11kg4
    Text: MCTG RELIABILITY AND QUALITY 1996 ANNUAL REPORT MRQSY96/D Microcontroller Technologies Group Reliability and Quality 1996 Annual Report To Our Valued Customers: Thank you for selecting Motorola as your preferred supplier of Microcontroller products. We in Motorola’s


    Original     		PDF MRQSY96/D 68hc11pa8 68hc11kg4 68B09E 68HC11PH8 HC711KG4 68HC11KA4 68HC57 68HC11L6 HC705B16 motorola 68hc11kg4

    Heraeus SOLDER PASTE F645

    Abstract: heraeus f816 heraeus F645 SA30C5-89M30 Heraeus paste profile SN63-90 Heraeus paste profile F645 heraeus heraeus f816 SN63-90 Heraeus pb free paste profile
    Text: SLVA333 Application Report May 2009 BGA Package Component Reliability After Long-Term Storage R. Key, B. Lange, R. Madsen ABSTRACT The white paper Component Reliability After Long Term Storage Texas Instruments application report SLVA304, http://focus.ti.com/lit/wp/slva304/slva304.pdf detailed a risk analysis with


    Original     		PDF SLVA333 SLVA304, com/lit/wp/slva304/slva304 Heraeus SOLDER PASTE F645 heraeus f816 heraeus F645 SA30C5-89M30 Heraeus paste profile SN63-90 Heraeus paste profile F645 heraeus heraeus f816 SN63-90 Heraeus pb free paste profile

    Transistor morocco 9740

    Abstract: Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS 388BGA
    Text: RELIABILITY REPORT Q98001 SICL BUSINESS UNIT REPORT NUMBER : Q98001 QUALIFICATION TYPE : NEW DEVICE - NEW PACKAGE DEVICE : STPC Client SIP101 SALES TYPES : STPCD0166BTC3 - STPCD0175BTC3 TECHNICAL CODE : MDBT*CHDT1BR PROCESS : HCMOS6 - CROLLES FAB LOCATION


    Original     		PDF Q98001 SIP101) STPCD0166BTC3 STPCD0175BTC3 388BGA Transistor morocco 9740 Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS

    xc68040

    Abstract: xc68307 MC88110 mpc 1488 mc68185 Motorola M 9587 xc68lc040 XPC106 MC88100 XPC105
    Text: BR1100/D REV 22 Microprocessor and Memory Technologies Group Reliability and Quality Report Third Quarter 1996 MICROPROCESSOR AND MEMORY TECHNOLOGIES GROUP RELIABILITY AND QUALITY REPORT QUARTER 3, 1996  MOTOROLA INC., 1996 To Our Valued Customers: Thank You! Thank you for selecting Motorola as your supplier of Microprocessor and Memory Products.


    Original     		PDF BR1100/D xc68040 xc68307 MC88110 mpc 1488 mc68185 Motorola M 9587 xc68lc040 XPC106 MC88100 XPC105

    u2225b

    Abstract: MCT12E U6204 U6202B U2829 U327M MC50K g1140 U2528B U427B
    Text: Quality and Reliability Report 1998 TEMIC Semiconductors 06.98 Table of Contents TEMIC QUALITY POLICY .1 QUALITY SYSTEM .2


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    68HC11L6

    Abstract: 68hc11ka4 68HC11PH8 68HC11a1 527 MOSFET TRANSISTOR motorola D65C 68HC05N4 nippon denso 68HC05B6 128 QFP 14x20
    Text: CMRQS/D REV 10 MOTOROLA MICROCONTROLLER TECHNOLOGIES GROUP RELIABILITY AND QUALITY MONITOR REPORT Quarter 1, 1997 Semiconductor Product Sector Test results contained herein are for information only. This report does not alter MotorolaÕs standard warranty or product speciÞcations.


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    EIAJ-IC-121-17

    Abstract: JESD22-A110 EIAJ-ED4701-D323 EIAJ-IC-121-18 MIL-STD-883 PRESSURE COOKER failure rate SM stress migration EIAJ-IC-121 JESD22A110
    Text: Quality and Reliability Report 5. Reliability Testing The purpose of reliability testing is to ensure that The purpose of the high-temperature operating life products are properly designed and assembled by HTOL test is to determine the reliability of subjecting them to stress conditions that acceler-


    Original     		PDF MIL-STD-883, 85C/140C EIAJ-IC-121-17 JESD22-A110 EIAJ-ED4701-D323 EIAJ-IC-121-18 MIL-STD-883 PRESSURE COOKER failure rate SM stress migration EIAJ-IC-121 JESD22A110

    DG300A-DG303A

    Abstract: No abstract text available
    Text: DG302A RELIABILITY REPORT FOR DG302AAK PLASTIC ENCAPSULATED DEVICES May 18, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.


    Original     		PDF DG302A DG302AAK DG302AAK /-400V /-250mA. NRKDGN004B, XRKBAL038Q, DG300A-DG303A

    Untitled

    Abstract: No abstract text available
    Text: MAX12528 RELIABILITY REPORT FOR MAX12528ETK+ PLASTIC ENCAPSULATED DEVICES November 22, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.


    Original     		PDF MAX12528 MAX12528ETK+ MAX12528ETK /-1000V JESD22-A114. /-250mA. QSU4BQ001C,

    outgoing material inspection format

    Abstract: MAX31855 Thermocouple Type K material testing MAX31855ESA MAX31855E
    Text: MAX31855 RELIABILITY REPORT FOR MAX31855ESA+ PLASTIC ENCAPSULATED DEVICES June 15, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.


    Original     		PDF MAX31855 MAX31855ESA+ /-2500V JESD22-A114. /-250mA JESD78. outgoing material inspection format MAX31855 Thermocouple Type K material testing MAX31855ESA MAX31855E

    Untitled

    Abstract: No abstract text available
    Text: MAX1123 RELIABILITY REPORT FOR MAX1123EGK+ PLASTIC ENCAPSULATED DEVICES September 12, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.


    Original     		PDF MAX1123 MAX1123EGK+ QFL0EQ001D /-1500V /-250mA. QFL0EQ001C,

    MAX8958

    Abstract: MAX8958EWW MTTF Intel PROCESSOR INTEL MTTF
    Text: MAX8958 RELIABILITY REPORT FOR MAX8958EWW+T WAFER LEVEL PRODUCTS October 10, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.


    Original     		PDF MAX8958 MAX8958EWW 100mA JESD78, EV2WAQ002A, MAX8958 MTTF Intel PROCESSOR INTEL MTTF

    MAX6902

    Abstract: DW11 MAX6902EKA TC05
    Text: MAX6902EKA Rev. A RELIABILITY REPORT FOR MAX6902EKA PLASTIC ENCAPSULATED DEVICES June 20, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl


    Original     		PDF MAX6902EKA MAX6902 100pf MAX6902) DW11 MAX6902EKA TC05

    DSA0025924

    Abstract: outgoing material inspection format max6900 sot23 MAX6900 MAX6900ETT TC05 qfn 3x3 socket
    Text: MAX6900ETT Rev. A RELIABILITY REPORT FOR MAX6900ETT PLASTIC ENCAPSULATED DEVICES May 13, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance


    Original     		PDF MAX6900ETT MAX6900 100pf 100mA DSA0025924 outgoing material inspection format max6900 sot23 MAX6900ETT TC05 qfn 3x3 socket

    IRFIBC44LC

    Abstract: MOSFET IRF 3710 transistor IRFZ46N irf2807 equivalent IRFIBC44 TO-220 IRF 3615 irfz46n irf 3215 mosfet irf 9740 transistor equivalent irf510
    Text: SWITCH RELIABILITY REPORT QUARTERLY REPORT NUMBER 57 OCTOBER 15, 1999 International Rectifier WORLD HEADQUARTERS: 233 KANSAS ST., EL SEGUNDO, CA 90245 USA • Tel: 310 322-3332 • TELEX 66-4464 EUROPEAN HEADQUARTERS: HURST GREEN, OXTED, SURREY RH8 9BB, UK • Tel: (44) 0883 714234 • TELEX 95219


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    c9013

    Abstract: 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638
    Text: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Quality System Manual QUALITY Reliabilty Report 1997-1998 RELIABILITY Integrated Silicon Solution, Inc. An ISO 9001 Company 1997 Integrated Silicon Solution, Inc.


    Original     		PDF R-118 c9013 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638

    70241k

    Abstract: d5611 61c256 ic 9022 61c64 RELIABILITY REPORT ISSI vacuum tubes CMS 2015 S/TRANSISTOR J 5804 EQUIVALENT 28F010P
    Text: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Reliability Report 1997-1998 An ISO 9001 Company 1997 Integrated Silicon Solution, Inc. Integrated Silicon Solution, Inc. • 2231 Lawson Lane • Santa Clara, CA 95054


    Original     		PDF R-118 70241k d5611 61c256 ic 9022 61c64 RELIABILITY REPORT ISSI vacuum tubes CMS 2015 S/TRANSISTOR J 5804 EQUIVALENT 28F010P

    receiving inspection procedure

    Abstract: reliability report QA procedure failure analysis research data reliability data analysis report
    Text: Quality and Reliability Report 4. Customer Return Handling Flow and Failure Analysis Procedures Customer Return Handling Flow Failure Analysis Procedures To ensure that customers receive prompt and ef- A successful failure analysis should indicate the ficient service, Winbond has developed a detailed


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    AN-7518

    Abstract: No abstract text available
    Text: Use of Life Tested Parts Application Note May 1999 AN-7518 Author: J. E. Vinson, Ph. D. History eyrds terrpoon, minctor mniions vin, e t, lility, reeni eful , ant rtalfails, arou Product Assumptions This report addresses high reliability product from an Intersil


    Original     		PDF AN-7518 AN-7518

    pj 989

    Abstract: PASIC 380 145026 14093 38980 report on PLCC solar cell Amorphous 144TQFP PACKAGE 84 pin plcc ic base QL8X12B-2
    Text: pASIC 1 FAMILY Reliability Report SUMMARY The pASIC device is a highly reliable Field Programmable Gate Array. The addition of the ViaLink to a CMOS process does not measurably increase the failure rate of the pASIC devices above that of normal CMOS logic products. The following is the summary of the High


    Original     		PDF pp27-30. pj 989 PASIC 380 145026 14093 38980 report on PLCC solar cell Amorphous 144TQFP PACKAGE 84 pin plcc ic base QL8X12B-2

    ACT1020

    Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b JEDEC-A113 ACTEL 1020B ACP55 smd U1p Jl03 JL-03
    Text: Quality & Reliability Guide February 2001 2001 Actel Corporation All Rights Reserved. Actel and the Actel logo are trademarks of Actel Corporation. All other brand or product names are the property of their respective owners. Contents 1. Overview of Actel’s Quality and Reliability Guide . . . . . . . . . . . . . . . . . . . .1


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    IC ANA 618

    Abstract: No abstract text available
    Text: PRODU CT DAT ASH EET OMx – DCR Series of Optical Channel Monitors Dynamic Channel Recognition for Mixed 10Gb/s-100Gb/s Formats Introducing the OMx-DCR Optical Channel Monitor – for Mixed 10Gb/s, 40Gb/s, 100Gb/s and beyond To meet current and future modulation format challenges in high capacity,


    Original     		PDF 10Gb/s-100Gb/s 10Gb/s, 40Gb/s, 100Gb/s 500ms 1000ms IC ANA 618