SAMSUNG NAND FLASH QUALIFICATION REPORT Search Results
SAMSUNG NAND FLASH QUALIFICATION REPORT Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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TC4011BP |
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CMOS Logic IC, 2-Input/NAND, DIP14 |
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TC4093BP |
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CMOS Logic IC, 2-Input/NAND, DIP14 |
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TC74HC00AP |
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CMOS Logic IC, Quad 2-Input/NAND, DIP14 |
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7UL1G00NX |
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One-Gate Logic(L-MOS), 2-Input/NAND, XSON6, -40 to 125 degC |
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TC7SH00FU |
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One-Gate Logic(L-MOS), 2-Input/NAND, SOT-353 (USV), -40 to 125 degC |
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SAMSUNG NAND FLASH QUALIFICATION REPORT Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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SAMSUNG NAND Flash Qualification Report
Abstract: SAMSUNG 128Mb NAND Flash Qualification Reliability NAND "read disturb" Samsung NAND Qualification Reliability NAND Flash Qualification Reliability NAND qualification NAND read disturb 63-TBGA K9F2808U0C-YCB0 K9F2808U0C-YIB0
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128Mb industria1980 30pcs 48TSOP1 SAMSUNG NAND Flash Qualification Report SAMSUNG 128Mb NAND Flash Qualification Reliability NAND "read disturb" Samsung NAND Qualification Reliability NAND Flash Qualification Reliability NAND qualification NAND read disturb 63-TBGA K9F2808U0C-YCB0 K9F2808U0C-YIB0 | |
SAMSUNG NAND FLASH TRANSLATION LAYER
Abstract: SAMSUNG NAND Flash Qualification Report SAMSUNG NAND FLASH TRANSLATION LAYER FTL vhdl code hamming ecc SAMSUNG 256Mb NAND Flash Qualification Report KS32P6632 SAMSUNG NAND FTL NAND FLASH TRANSLATION LAYER FTL vhdl code hamming block diagram code hamming using vhdl
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128Mb 256Mb) 256Mb 512Mb 500us SAMSUNG NAND FLASH TRANSLATION LAYER SAMSUNG NAND Flash Qualification Report SAMSUNG NAND FLASH TRANSLATION LAYER FTL vhdl code hamming ecc SAMSUNG 256Mb NAND Flash Qualification Report KS32P6632 SAMSUNG NAND FTL NAND FLASH TRANSLATION LAYER FTL vhdl code hamming block diagram code hamming using vhdl | |
K9F1208R0C-JIB0
Abstract: K9F1208U0C K9F1208U0C-PCB0 K9F1208R0C-JIB K9F1208R0C K9F1208R0C-JIB00 SAMSUNG NOR Flash Qualification Report
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C K9F1208R0C-JIB0T 824KB K9F1208R0C-JIB00 K9F1208R0C-JIB0T K9F1208R0C-JIB0 K9F1208U0C-PCB0 K9F1208R0C-JIB SAMSUNG NOR Flash Qualification Report | |
SAMSUNG NAND Flash Qualification Report
Abstract: K9F1208U0CJIB0 marking date code samsung semiconductor
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C K9F1208U0C-FIB00 \AVNET\09082007\SAMS\K9F1208U0C-PIB0T00 07-Sep-2007 K9F1208U0C-JIB00 K9F1208U0C-JIB0T K9F1208U0C-PCB00 SAMSUNG NAND Flash Qualification Report K9F1208U0CJIB0 marking date code samsung semiconductor | |
K9F1208U0C-PCB0
Abstract: marking date code samsung semiconductor K9F1208U0C K9F1208U0CPCB0 K9F1208U0C-JIB0 K9F1208U0CJIB0 K9F1208U0C-PIB K9F1208U0CPIB0 K9F1208U0CJIB0T K9F1208U0C-JIB0T
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C o824KB K9F1208U0C-FIB00 K9F1208U0C-JIB00 K9F1208U0C-JIB0T K9F1208U0C-PCB00 K9F1208U0C-PCB0T K9F1208U0C-PCB0 marking date code samsung semiconductor K9F1208U0CPCB0 K9F1208U0C-JIB0 K9F1208U0CJIB0 K9F1208U0C-PIB K9F1208U0CPIB0 K9F1208U0CJIB0T | |
SAMSUNG NAND Flash Qualification Report
Abstract: No abstract text available
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C K9F1208U0C-FIB00 \AVNET\09082007\SAMS\K9F1208U0C-PIB0000 07-Sep-2007 K9F1208U0C-JIB00 K9F1208U0C-JIB0T K9F1208U0C-PCB00 SAMSUNG NAND Flash Qualification Report | |
K9F1G08U0C
Abstract: K9F1G08U0C-PIB0 K9F1G08U0C-PCB0 K9F1G08U0C-P SAMSUNG K9F1G08U0C NAND Flash Qualification Report K9F1G08B0C K9F1G08U0C TSOP K9F1G08U0CPCB0 K9F1G08X0C SAMSUNG NAND Flash Qualification Report
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K9F1G08B0C K9F1G08U0C K9F1G08X0C K9F1G08U0C K9F1G08U0C-PIB0 K9F1G08U0C-PCB0 K9F1G08U0C-P SAMSUNG K9F1G08U0C NAND Flash Qualification Report K9F1G08U0C TSOP K9F1G08U0CPCB0 K9F1G08X0C SAMSUNG NAND Flash Qualification Report | |
RCD 1230 SAMSUNG
Abstract: ST OneNAND samsung confidential samsung nor flash Flash Memory SAMSUNG OneNAND SAMSUNG NAND Qualification BLOCK37
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OneNAND512/OneNAND1GDDP 512Mb KFG1216Q2M-DEB KFG1216D2M-DEB KFG1216U2M-DIB KFH1G16Q2M-DEB KFH1G16D2M-DEB KFH1G16U2M-DIB 63FBGA RCD 1230 SAMSUNG ST OneNAND samsung confidential samsung nor flash Flash Memory SAMSUNG OneNAND SAMSUNG NAND Qualification BLOCK37 | |
K9F2G08U0M-PCB0
Abstract: 512M x 8 Bit NAND Flash Memory K9F2G08U0M K9F2G08U0M-XIB0 K9F2G08U0M-YCB0 48-pin TSOP (I) flash memory K9F2G08U0 SAMSUNG NAND Flash Qualification Report samsung toggle mode NAND K9K4G08U1M
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K9K4G08U1M K9F2G08U0M K9XXG08UXM 200mV K9F2G08U0M-PCB0 512M x 8 Bit NAND Flash Memory K9F2G08U0M K9F2G08U0M-XIB0 K9F2G08U0M-YCB0 48-pin TSOP (I) flash memory K9F2G08U0 SAMSUNG NAND Flash Qualification Report samsung toggle mode NAND K9K4G08U1M | |
K9F2G08U0B
Abstract: K9F2G08U0B-P K9F2G08X0B K9F2G08U0 SAMSUNG NAND Flash Qualification Report SAMSUNG 4gb NAND Flash Qualification Report samsung k9f2g08U0b K9F2G08 K9F2G08B0B K9F2G08B0B-P
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K9F2G08B0B K9F2G08U0B K9F2G08X0B K9F2G08U0B K9F2G08U0B-P K9F2G08X0B K9F2G08U0 SAMSUNG NAND Flash Qualification Report SAMSUNG 4gb NAND Flash Qualification Report samsung k9f2g08U0b K9F2G08 K9F2G08B0B-P | |
K9F1208U0C-PCB
Abstract: No abstract text available
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C K9F1208U0C-FIB00 \AVNET\09082007\SAMS\K9F1208U0C-PCB0000 07-Sep-2007 K9F1208U0C-JIB00 K9F1208U0C-JIB0T K9F1208U0C-PCB00 K9F1208U0C-PCB | |
K9F2G08U0B-PCB0
Abstract: K9F2G08U0B SAMSUNG 4gb NAND Flash Qualification Report SAMSUNG 128Mb NAND Flash Qualification Reliability K9F2G08X0B K9F2G08U0B-PCB samsung k9f2g08U0b samsung 8GB Nand flash two-plane program nand bad block samsung
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K9F2G08B0B K9F2G08U0B K9F2G08X0B K9F2G08U0B-PCB0 K9F2G08U0B SAMSUNG 4gb NAND Flash Qualification Report SAMSUNG 128Mb NAND Flash Qualification Reliability K9F2G08X0B K9F2G08U0B-PCB samsung k9f2g08U0b samsung 8GB Nand flash two-plane program nand bad block samsung | |
K9F1G08U0D-SCB0
Abstract: K9F1G08U0D K9F1G08U0C K9F1G08U0D-SCB K9F1G08U0D-S SAMSUNG K9F1G08U0D K9F1G08U0D-HCB0 K9F1G08U0D-H K9F1G08X0D-SCB0 K9F1G08X0D
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K9F1G08U0D K9F1G08U0C 200us 700us K9F1G08U0D 250us 750us K9F1G08U0D-SCB0 K9F1G08U0D-SCB K9F1G08U0D-S SAMSUNG K9F1G08U0D K9F1G08U0D-HCB0 K9F1G08U0D-H K9F1G08X0D-SCB0 K9F1G08X0D | |
512M x 8 Bit NAND Flash Memory
Abstract: K9F2G16U0M K9F2G08Q0M K9F2G16X0M
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K9K4G08U1M K9F2G08U0M K9F2G16U0M 200mV 512M x 8 Bit NAND Flash Memory K9F2G16U0M K9F2G08Q0M K9F2G16X0M | |
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K9F2808
Abstract: No abstract text available
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K9F2808Q0B-DCB0 K9F2808U0B-VCB0 K9F2808U0B-YCB0 K9F2808U0B-DCB0 K9F2808Q0B K9F2808U0B K9F2808Q0B 200us 300us 100ns K9F2808 | |
Untitled
Abstract: No abstract text available
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K9F2808Q0B-DCB0 K9F2808U0B-VCB0 K9F2808U0B-YCB0 K9F2808U0B-DCB0 K9F2808Q0B K9F2808U0B K9F2808Q0B 200us 300us 100ns | |
K9F1208U0C-PCB0
Abstract: K9F1208U0C k9f1208u0cpcb0 k9f1208r0c K9F1208X0C K9F1208U0C-P K9F1208B0C K9F1208B0C-P K9F1208R0C-J
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C 100ns) K9F1208U0C-PCB0 K9F1208U0C k9f1208u0cpcb0 K9F1208X0C K9F1208U0C-P K9F1208B0C K9F1208B0C-P K9F1208R0C-J | |
Untitled
Abstract: No abstract text available
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K9F2808Q0B K9F2808U0B K9F2808U0B K9F2808Q0B 200us 300us 100ns | |
K9F2808U0B-YCB0
Abstract: K9F2808Q0B K9F2808Q0B-D K9F2808Q0B-DCB0 K9F2808U0B K9F2808U0B-DCB0 K9F2808U0B-VCB0 K9F2808U0B-Y
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K9F2808Q0B-DCB0 K9F2808U0B-VCB0 K9F2808Q0B K9F2808U0B-YCB0 K9F2808U0B-DCB0 K9F2808U0B K9F2808Q0B 200us 300us 100ns K9F2808Q0B-D K9F2808U0B-Y | |
Untitled
Abstract: No abstract text available
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K9K2G08U0A K9K2G08R0A K9K2G08X0A 200mV | |
K9K2G08U0A-FIB0
Abstract: K9F1G08 K9F1G08X0A K9K2G08R0A
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K9K2G08U0A K9K2G08R0A K9K2G08X0A 200mV K9K2G08U0A-FIB0 K9F1G08 K9F1G08X0A K9K2G08R0A | |
K9F1208U0C-PCB0
Abstract: K9F1208U0C K9F1208* technical K9F1208X0C K9F1208B0C-P K9F1208R0C k9f1208u0cpcb0 K9F1208B0C K9F1208R0C-J K9F1208U0C-P
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K9F1208U0C K9F1208R0C K9F1208B0C K9F1208X0C 100ns) K9F1208U0C-PCB0 K9F1208U0C K9F1208* technical K9F1208X0C K9F1208B0C-P k9f1208u0cpcb0 K9F1208B0C K9F1208R0C-J K9F1208U0C-P | |
K9F4G08U0B
Abstract: K9F4G08U0B-PCB0 K9G4G08U0B Samsung k9f4g08u0b SAMSUNG 4gb NAND Flash Qualification Report K9F4G08U0B-I SAMSUNG NAND Flash Qualification Report K9G4G08B0B SAMSUNG 256Mb NAND Flash Qualification Reliability k9f4g08u0bpcb0
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K9K8G08U1B K9F4G08U0B K9F4G08B0B K9XXG08XXB K9F4G08U0B-PCB0 K9G4G08U0B Samsung k9f4g08u0b SAMSUNG 4gb NAND Flash Qualification Report K9F4G08U0B-I SAMSUNG NAND Flash Qualification Report K9G4G08B0B SAMSUNG 256Mb NAND Flash Qualification Reliability k9f4g08u0bpcb0 | |
Untitled
Abstract: No abstract text available
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K9F2808Q0B-DCB0 K9F2808U0B-VCB0 K9F2808U0B-YCB0 K9F2808U0B-DCB0 K9F2808U0B K9F2808Q0B 200us 300us 100ns K9F2808Q0B |