SN74LVC112A
Abstract: No abstract text available
Text: SN74LVC112A DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET SCAS289D – JANUARY 1993 – REVISED JANUARY 1997 D D D D D D D EPIC Enhanced-Performance Implanted CMOS Submicron Process ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
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Original
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SN74LVC112A
SCAS289D
MIL-STD-883,
JESD-17
SN74LVC112A
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PDF
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SN74LVC112A
Abstract: No abstract text available
Text: SN74LVC112A DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET SCAS289D - JANUARY 1993 - REVISED JANUARY 1997 • • • • • • • EPIC Enhanced-Performance Implanted CMOS Submicron Process ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V
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OCR Scan
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SN74LVC112A
SCAS289D
MIL-STD-883,
JESD-17
1til723
SN74LVC112A
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PDF
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