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    Untitled

    Abstract: No abstract text available
    Text: SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311A - MARCH 1994 - REVISED JULY 1994 Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard


    OCR Scan     		SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 18-BIT SCBS311A LVT182646 PDF

    Untitled

    Abstract: No abstract text available
    Text: SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311A-MARCH 1 9 9 4 - REVISED JULY 1994 • Members of the Texas Instruments SCOPE Family of Testability Products • Members of the Texas Instruments


    OCR Scan     		SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 18-BIT SCBS311A-MARCH PDF