m-bus
Abstract: bus arbitration protocol MC68681 PROGRAMMING EXAMPLE MC68681 MCF5307 sbx 1810
Text: INDEX A accumulator ACC , 3-11 addressing mode summary, 3-20 B BDM, 2-14 BDM/JTAG signals test clock (TCK), 2-14 test data input/development serial input (TDI/DSI), 2-14 test data output/development serial output (TDO/DSO), 2-15 test mode select/break point (TMS/BKPT),
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MC68681,
MCF5307
Index-11
Index-12
m-bus
bus arbitration protocol
MC68681 PROGRAMMING EXAMPLE
MC68681
sbx 1810
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Untitled
Abstract: No abstract text available
Text: BTSD08 SerDes Test Device Description Features The adoption of serial link technology in VPX and ATCA poses significant • Multi-lane differential serial fabric test unit debug, characterization, and test challenges. The BTSD08 is an ultra low cost • Flexible design allows signal analysis for various architectures
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BTSD08
BTSD08,
anBTSD08
BTSD08
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AN987
Abstract: ST72 AN-987
Text: AN987 APPLICATION NOTE ST7 SERIAL TEST CONTROLLER PROGRAMMING by Microcontroller Division Applications INTRODUCTION This application note describes: – The advantages of Serial Test Controller Programming STCP vs. programming using an EPROM programming board (EPB) (see Section 2.1).
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AN987
AN987
ST72
AN-987
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1340B
Abstract: No abstract text available
Text: Configuration of the NVM Serial Test Interface Database with Recommendations for Pad Placement and Simulation Description Introduction This application note describes the contents and organization of the NVM serial test interface database which should be submitted to Atmel with each circuit
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1340B
05/00/0M
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LF3312
Abstract: TDI timing
Text: JTAG Boundary Scan Testing LF3312 - Application Note IEEE 1149.1 Serial Boundary Scan JTAG The LF3312 incorporates a serial boundary scan test access port (TAP) in its BGA package. This device is compliant with IEEE Standard #1149.1-1900. Test Access Port Clock - TCK
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LF3312
TDI timing
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AN-889
Abstract: SCANPSC100F AN889 fairchild tdi 8 bit LFSR for test pattern generation
Text: Fairchild Semiconductor Application Note 889 April 1993 ABSTRACT The IEEE Std. 1149.1 Standard Test Access Port and Boundary-Scan Architecture1 as well as other scan path methodologies use a serial interface for transmitting data to and from the circuit under test. This serial communication
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SCANPSC100F,
AN-889
SCANPSC100F
AN889
fairchild tdi
8 bit LFSR for test pattern generation
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AN889
Abstract: 8 bit LFSR for test pattern generation AN-889 C1996 SCANPSC100F 32 Bit Counter parallel to serial conversion in C IEEE paper simple LFSR PSC100F AN-889 national
Text: National Semiconductor Application Note 889 Jay Brown April 1993 ABSTRACT The IEEE Std 1149 1 Standard Test Access Port and Boundary-Scan Architecture1 as well as other scan path methodologies use a serial interface for transmitting data to and from the circuit under test This serial communication
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SCANPSC100F
AN889
8 bit LFSR for test pattern generation
AN-889
C1996
32 Bit Counter
parallel to serial conversion in C IEEE paper
simple LFSR
PSC100F
AN-889 national
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MAX232 IC PIN DETAILS
Abstract: EDE700 max232 level shifter 16c84 40 pin LCD connector HD44780 MAX232 PIC16C621 PIC16C84 T2400
Text: EDE700 Serial LCD Interface IC EDE700 0=2400,1=9600 1 BAUD 0=Inverted,1=Standard 2 POLARITY 0=Diagnostic Mode 3 Connect to +5V DC XMIT 18 Serial Transmit RCV 17 Serial Receive TEST OSC1 16 Oscillator Connection 4 +5V OSC2 15 Oscillator Connection Digital Ground
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EDE700
EDE700
MAX232 IC PIN DETAILS
max232 level shifter
16c84
40 pin LCD connector
HD44780
MAX232
PIC16C621
PIC16C84
T2400
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Untitled
Abstract: No abstract text available
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is
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SCANPSC100F
PSC100F
scaCANPSC100FMW
5962-9475001QYA
SCANSTA101WQML
2-Sep-2000]
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SCANPSC100FSC
Abstract: SCANPSC100FSCX SCANPSC100F SCANPSC100FFMQB
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is
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SCANPSC100F
SCANPSC100F
PSC100F
SCANPSC100FSC
SCANPSC100FSCX
SCANPSC100FFMQB
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SCANPSC100F
Abstract: fairchild tdi 1999 Dynamic Memory Refresh Controller
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is
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SCANPSC100F
SCANPSC100F
PSC100F
fairchild tdi 1999
Dynamic Memory Refresh Controller
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SCANPSC100F
Abstract: Dynamic Memory Refresh Controller
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is
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SCANPSC100F
SCANPSC100F
PSC100F
indepe959
Dynamic Memory Refresh Controller
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SCANPSC110F
Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Text: General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a
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SCANPSC110F
32-bit
cou85
ds011570
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
SCANPSC110FSC
SCANPSC110FSCX
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AN3964
Abstract: APP3964 MAX9218 MAX9247 MAX9248 MAX9250 PRBS
Text: Maxim > App Notes > AUTOMOTIVE CLOCK GENERATION AND DISTRIBUTION HIGH-SPEED SIGNAL PROCESSING Keywords: Test Mode, PRBS, MAX9247, LVDS Testing, Serializer HIGH-SPEED INTERCONNECT Dec 15, 2006 APPLICATION NOTE 3964 Enabling Test Modes on the MAX9247 Abstract: The MAX9247 features an internal test mode, which is useful for debugging the serial link or
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MAX9247,
MAX9247
MAX9247
27-bit,
42MHz
com/an3964
MAX9218:
AN3964
APP3964
MAX9218
MAX9248
MAX9250
PRBS
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SCANPSC110
Abstract: SCANPSC110F SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
SCANPSC110F
SCANPSC110
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
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SCANPSC110F
Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
SCANPSC110F
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
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code 4 bit LFSR
Abstract: h bridge CSP
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
code 4 bit LFSR
h bridge CSP
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MAX1069
Abstract: MAX1169 MAX1169ACUD MAX1169AEUD MAX1169BCUD MAX1169BEUD MAX1169CCUD MAX1169CEUD
Text: 19-2654; Rev 0; 10/02 58.6ksps, 16-Bit, 2-Wire Serial ADC in a 14-Pin TSSOP Applications Hand-Held Portable Applications Medical Instruments Battery-Powered Test Equipment Solar-Powered Remote Systems Features ♦ High-Speed Serial Interface 400kHz Fast Mode
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16-Bit,
14-Pin
400kHz
50ksps
10ksps
MAX1169ACUD*
MAX1169
MAX1069
MAX1169
MAX1169ACUD
MAX1169AEUD
MAX1169BCUD
MAX1169BEUD
MAX1169CCUD
MAX1169CEUD
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Untitled
Abstract: No abstract text available
Text: Model DLC08 Revere High-Performance Digital Load Cell Interface FEATURES • Serial interface RS-485 • All settings made through the serial interface • Simple calibration, test and setting via HyperTerminal programming, or via Revere’s software • Automatic unit conversion, zero tracking
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DLC08
RS-485)
27-Apr-2011
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lfsr16
Abstract: SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110F
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is
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SCANPSC110F
IEEE1149
SCANPSC110F
lfsr16
SCANPSC110FFMQB
SCANPSC110FLMQB
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64 CERAMIC LEADLESS CHIP CARRIER LCC
Abstract: C1996 SCANPSC110F SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149 1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std 1149 1 test bus into a multidrop test bus environment The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
64 CERAMIC LEADLESS CHIP CARRIER LCC
C1996
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
SCANPSC110FSC
SCANPSC110FSCX
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Untitled
Abstract: No abstract text available
Text: N5412B Serial Attached SCSI-2 SAS-2 Compliance Test Software for Infiniium 90000 Series Oscilloscopes Data Sheet N5421A SAS IT/IR Test Fixtures for SFF-8482 SAS x2 Internal Plug/Receptacle Interfaces Features The N5412B SAS-2 electrical test software simplifies the validation of
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N5412B
N5421A
SFF-8482
5990-6308EN
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Untitled
Abstract: No abstract text available
Text: PRODUCT SPECIFICATION TITLE SERIAL ATA BACKPLANE CONNECTOR / 1.27mm PITCH 1.0 SCOPE This Product Specification covers the mechanical, electrical and environmental performances requirements and test methods for Serial-ATA connector series products. 2.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS
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50-durability
500durability
SH2009-0536
PS-67492-001
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ic 8255 PPI
Abstract: PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda
Text: Honeywell Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability • Serial Chip-Level Test Interface
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P1149
HTIU2100
ic 8255 PPI
PPI 8255 interface data serial
8255 PPI Chip
PPI 8255 interface word control
Control word 8255 PPI
ppi interface 1007
SC1114
NUM mnda
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