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    SNJ54LVTH245W

    Abstract: 54LVTH245 qml-38535 CQCC1-N20 GDFP2-F20
    Text: REVISIO N S D E SC R IPT IO N LTR DATE YR-MO-DA A PPRO VED Change the Vcc voltage levels for Ground Bounce tests. - C S 97-04-24 Monica L. Poelking Change the device name to reflect the Bus Hold feature, and adjust limits to characterize the performance of the optimized die. Editorial changes


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    PDF T0D47DB SNJ54LVTH245W 54LVTH245 qml-38535 CQCC1-N20 GDFP2-F20