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    4B942 Price and Stock

    Anatech Electronics Inc AB704B942

    RF FILTER BANDPASS 704MHZ MODULE
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    DigiKey AB704B942 Box 1
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    4B942 Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    2a92

    Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 2a92 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9 PDF

    27C1024

    Abstract: MIL-M-38535 2C9237 4B942 3B93
    Text: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original
    AT-27C1024 MIL-M-38535 AT-27C010 AT-27C1024 27C1024 2C9237 4B942 3B93 PDF

    5A9516

    Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 5A9516 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126 PDF

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original
    AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906 PDF

    Untitled

    Abstract: No abstract text available
    Text: 1 1 1 1223456457 1234567894A2B894CDEF4244797 4D!87 8"4 *#4DFA*-&'$%*FA4 #$%&'# 4 4 -A9 ! -A9 ! 56 #" 895A # 733 733 -A9 -A9 5/4263 !! ! !"   % 9$"! & 9652 $ 38-2. + 5693. # 733456 ! 8-./0  5693 " 38-2 # + $ & % 123


    Original
    1234567894A2B894CDEF4 9344A576B 98/D787AB 87D76B 9647A D74D93 //96B-4 6518918F51EDC F51CD15E6 4F8C95 PDF

    tsop 338

    Abstract: 28c010 28C010 Atmel 4C016 4b23 4h5229 4A05 MIL-M-38535 2D93 6F9630
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C010 CMOS EEPROM RELIABILITY DATA* - 150°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-28C010 MIL-M-38535 AT-28C256 AT-28C040 AT-28C010 7G9822 6H9708 9G9937 9G9939 tsop 338 28c010 28C010 Atmel 4C016 4b23 4h5229 4A05 2D93 6F9630 PDF

    29C256

    Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MIL-M-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 report on PLCC tsop 6 3A0081 PDF

    29C040

    Abstract: AT29C040 4D9511
    Text: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C040 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C040 AT-29C040 3C0380 4A1756 4C1203 4C0945 4H5199 4D2648 5E0635 3C9342 29C040 AT29C040 4D9511 PDF

    27c512r

    Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
    Text: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)


    Original
    AT-27C512R MIL-M-38510 AT-27C256R AT-27C010 AT-27C512/512R 2J0301 4J0451 6J0707 7F0721 27c512r ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484 PDF

    28HC64

    Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
    Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.


    Original
    AT-28HC64 MIL-M-38535 AT-28HC191/291 AT-28PC64 AT-28C256 AT-28HC16/17 AT-28HC64 033474C 234583C1 28HC64 28PC64 28HC16 9C8944 Activation Energy PDF

    29C256

    Abstract: 29C257 PLCC 64
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MILM-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 PLCC 64 PDF