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    Panasonic Electronic Components ERJ-PB3B9312V

    RES SMD 93.1K OHM 0.1% 1/5W 0603
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    Panasonic Electronic Components ERJ-PB3B9311V

    RES SMD 9.31K OHM 0.1% 1/5W 0603
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    TE Connectivity CPF0603B93K1E1

    RES SMD 93.1KOHM 0.1% 1/16W 0603
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    Panasonic Electronic Components ERJ-PB3B9310V

    RES SMD 931 OHM 0.1% 1/5W 0603
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    TE Connectivity CPF0603B931RE1

    RES SMD 931 OHM 0.1% 1/16W 0603
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    3B93 Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    2a92

    Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 2a92 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9 PDF

    27C1024

    Abstract: MIL-M-38535 2C9237 4B942 3B93
    Text: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original
    AT-27C1024 MIL-M-38535 AT-27C010 AT-27C1024 27C1024 2C9237 4B942 3B93 PDF

    MB90F0

    Abstract: H352 MB90F931
    Text: FUJITSU MICROELECTRONICS CONTROLLER MANUAL CM44-10150-1E F2MC-16LX 16-BIT MICROCONTROLLER MB90930 Series HARDWARE MANUAL F2MC-16LX 16-BIT MICROCONTROLLER MB90930 Series HARDWARE MANUAL For the information for microcontroller supports, see the following web site.


    Original
    CM44-10150-1E F2MC-16LX 16-BIT MB90930 F2MC16LX MB90F0 H352 MB90F931 PDF

    specification of curve tracer

    Abstract: coros steel 1541 ATV2500 VPP MIL-M-38535 2C9240
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-22V10 CMOS PROGRAMMABLE LOGIC ARRAYS RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC)


    Original
    AT-22V10 MIL-M-38535 AT-V750 AT-V2500 AT-V5000 AT-22V10 specification of curve tracer coros steel 1541 ATV2500 VPP 2C9240 PDF

    5A9516

    Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 5A9516 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126 PDF

    q9898

    Abstract: ac3b 639E 221C A127 m7217 j631
    Text: ! ! " #$ % && ' ! ' % ' * + *,* -, * , . /! ' 0, & 1 2 !& ' $34& 5 " * ' * , ,* $" % 677 8 & 8 *7 3 7 ', ' ' , 3 ( 6 , ( & 0, !"# &' () *+ 122 %31 5 ) 4!33 , - . & $ % *) + $& / 0. + 123 # %122 %31 %6 # ) "3 2!4!3 7 8 , $629 7 %122 %31 %6 6 " 1= 9 = 1 & 3


    Original
    PDF

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original
    AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906 PDF

    2a92

    Abstract: 3B9335 3C9343 AT29C010 32PDIP
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-29C010 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original
    AT-29C010 AT-29C010 3A0946-2 3A1195 3C0337 3D0897 3C0714 4A0088 4A1536 4A1990 2a92 3B9335 3C9343 AT29C010 32PDIP PDF

    28c64b

    Abstract: 28HC64b 5a9520 6D1565 7A3015-1 MIL-M-38535 6C9646 6D9702
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64B PEROM RELIABILITY DATA -150°C OPERATING LIFE TEST -200°C RETENTION BAKE -CYCLE TEST -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original
    AT-28C64B MIL-M-38535 AT-28C256 AT-28HC64B AT-28C64B 3B0935 3B9329 4D9508 28c64b 28HC64b 5a9520 6D1565 7A3015-1 6C9646 6D9702 PDF

    G1338

    Abstract: No abstract text available
    Text: 123456789ABCDEDFDBC 11B3 1234546789A8B2CDEFD8 254728C88A8  F3 !"# # $%!&3B9D7'936B62  1! 3 3 !"#3


    Original
    123456789ABCDEDF 1234546789A8B2CDEFD 12234567893A758BCD834E3F2 367D3 367D37D+ D7D83 935-3F2 D73A758BC 6E34D3 D7936 G1338 PDF

    29C256

    Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MIL-M-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 report on PLCC tsop 6 3A0081 PDF

    M1014

    Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
    Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS


    Original
    AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352 PDF

    28C64 EEPROM

    Abstract: eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C64 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -DATA RETENTION BAKE (200°C) -CYCLE TEST -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY LIFE TEST


    Original
    AT-28C64 AT-28C64 187-3B 133317B2 232510B-2 3A0781 3A0782B1 4B1973 4D1971 4D1971-2 28C64 EEPROM eeprom 28c64 28c64 OB9028 K1909 6D9709 8823 2C9236 6B1999-1 6A9616 PDF

    27c080

    Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.


    Original
    AT-27C080 MIL-M-38535 AT-27C040 AT-27C4096 AT-27C080 A3B0575-2 3B9336 A3B0575-1 3B9331 27c080 tsop 138 atmel 27c080 resistor activation energy tsop40 3D0442-1 PDF

    28HC64

    Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
    Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.


    Original
    AT-28HC64 MIL-M-38535 AT-28HC191/291 AT-28PC64 AT-28C256 AT-28HC16/17 AT-28HC64 033474C 234583C1 28HC64 28PC64 28HC16 9C8944 Activation Energy PDF

    D3950

    Abstract: No abstract text available
    Text: 123456789AB7C2D71EF 123456  !2"#$21A%!A& 1234546789A892BCDECF8 254728BF88A8  F3 !" #$%!&'1 &F& 3B9D7*936B62 'C2(&AC1"# 3 !" 3 +


    Original
    123456789AB7C2D71EF 1234546789A892BCDECF8 12234567893A758BCD834E3F2 367D3 /D7D50-367D37D. D7D83 67193503F2 /D73A758BC 6E34D3 /D7936 D3950 PDF

    EEPROM 28C256

    Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-28C256 MIL-M38535 AT-28C010 AT-28C040 AT-28C256 1C0302 3E0319 3E0323 3G0338 EEPROM 28C256 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638 PDF

    29C256

    Abstract: 29C257 PLCC 64
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C256 MILM-38535 AT-29C257 AT-29C256 2D9303 3A9313 3A9318 3B9324 29C256 29C257 PLCC 64 PDF

    29c512 datasheet

    Abstract: 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C512 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original
    AT-29C512 AT-29C512 B3B0684 4A0927 4A2182 4D0262 5G1621 2D9303 3B9327 4A9422 29c512 datasheet 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940 PDF

    22V10B

    Abstract: ATV750 MIL-M-38535
    Text: PAGE 1 OF 2 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-V750B EPLD RELIABILITY DATA* -125°C OPERATING LIFE TEST * This report was generated from ATV750 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A:


    Original
    AT-V750B ATV750 MIL-M-38535 AT-22V10B AT-V2500 AT-V750B 3D0810 3B9343 4A0595 4A9425 22V10B PDF

    Untitled

    Abstract: No abstract text available
    Text: SSI 32R2220RW ¿¡¡kmsustans’ +5V, 2-, 4-Channel Thin Film Read/Write Device A TDK Group/Company Advance Information February 1995 DESCRIPTION FEATURES The SSI 32R2220RW is a BiCMOS m onolithic integrated circuit designed for use with two-terminal recording heads. It provides a low noise read amplifier,


    OCR Scan
    32R2220RW SSI32R2220RWoptionprovides 32R2220Woption 20-Lead 3B-95 PDF

    Untitled

    Abstract: No abstract text available
    Text: SSI 32R2220RW ¿ +5V, 2-, 4-Channel Thin Film Read/Write Device ih m s y s te m s A TDK Group/Company Advance Information February 1995 DESCRIPTION FEATURES The SSI 32R2220RW is a BiCMOS monolithic Integrated circuit designed for use with two-terminal recording heads. It provides a low noise read amplifier,


    OCR Scan
    32R2220RW 32R2220RW 32R2220RWoption 32R2220Woption 20-Lead 3B-95 PDF

    Untitled

    Abstract: No abstract text available
    Text: 4 3 2 7 R E V IS IO N S ISS ZO N E D ES 0 RI P T I0 N \ PER R EQ U ESTX DATE F CABLES: - FI LOT EX NO ETUDE 2 T 6 0 9 T - T B R /C A B —SP.D1 - ST 2 1 2 fSIRTI TCE2HH2 RECOMMENDED CABLE STRI PPI NG DI M’S E R ECOMMENDED COUNTING MODE ca d . PANEL THICKNESS:


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    22T-944 1566421AF-E20 3B-931-17D PDF

    rj45-8p8c

    Abstract: RJ458P8C RJ45 8p8c rj45-8p 6p6c 8P8C RJ45
    Text: XRJS Series RJ11/RJ45, Unshielded/Shielded, S M T T y p e it Numbering: XRJS - X - X X - X - X - X - X X X C O LD PLATING OPTIONS SPECIAL CODES SHIELDING OPTIONS s: Shielded U: Unshielded RUNNING CODES NUMBER OF PORTS NUMBER OF POSITIONS LED COLOR OPTIONS


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    PDF