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    CY100E474 Search Results

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    CY100E474 Price and Stock

    Rochester Electronics LLC CY100E474L-7JCQ

    1024 X 4 ECL SRAM
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey CY100E474L-7JCQ Bulk 14
    • 1 -
    • 10 -
    • 100 $21.85
    • 1000 $21.85
    • 10000 $21.85
    		Buy Now

    Cypress Semiconductor CY100E474L-7JCQ

    CY100E474L-7JCQ
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Verical CY100E474L-7JCQ 83 15
    • 1 -
    • 10 -
    • 100 $24.6875
    • 1000 $22.325
    • 10000 $22.325
    		Buy Now
    Rochester Electronics CY100E474L-7JCQ 83 1
    • 1 $21.01
    • 10 $21.01
    • 100 $19.75
    • 1000 $17.86
    • 10000 $17.86
    		Buy Now

    Cypress Semiconductor CY100E474L-5DC

    STANDARD SRAM, 1KX4, 5NS, ECL100K, CDIP24
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Quest Components CY100E474L-5DC 135
    • 1 $15.6
    • 10 $15.6
    • 100 $14.4
    • 1000 $14.4
    • 10000 $14.4
    		Buy Now
    CY100E474L-5DC 8
    • 1 $20
    • 10 $15
    • 100 $15
    • 1000 $15
    • 10000 $15
    		Buy Now

    CY100E474 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    CY62256LL-PC

    Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
    Text: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2


    Original     		PDF PALCE22V10-JC FLASH-FL22D CY62256LL-PC VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113

    M63064

    Abstract: M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069 M63057
    Text: RELIABILITY MONITOR SUMMARY Description of Data Table Column Headings AAA AAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA


    Original     		PDF FAMOS-P26 CY27H010-WC M63057 CY27H512-JC CY38007-NC FAMOS-VL27D M63064 M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069

    CY27S03A

    Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
    Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability


    Original     		PDF CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide

    CY7C9101

    Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
    Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the


    Original     		PDF

    Gunn Diode symbol

    Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
    Text: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.


    Original     		PDF 62x10-5 Gunn Diode symbol cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet

    10E474

    Abstract: No abstract text available
    Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR Features • On-chip voltage compensation for im­ proved noise margin • 1024 x 4-bit organization • Ultra high speed/standard power — *AA = 3.5 ns • Open emitter output for ease of memory expansion • Industry-standard pinout


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K CY100E474 CY100E474L CY100E474L-- 100E474L-- 10E474

    Untitled

    Abstract: No abstract text available
    Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • 1024 x 4 - b it organization • Ultra high speed/standard power — 1 \ \ = 3.5 ns — Iee = 275 mA • Low-power version — Iaa = 5 ns — Iee = 190 mA • Both 10KH/10K- and 100K-compatible I/O versions • 10K/10KH military version


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K- 100K-compatible 10K/10KH CY10E474 CY10E474â CY10E474Lâ

    A301D

    Abstract: No abstract text available
    Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • On-chip voltage compensation for im­ proved noise margin Features • 1024 x 4 ECL Static RAM 1024 x 4 -b it organization • Open em itter output for ease of memory expansion • Ultra high speed/standard power


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K- 100K-compatible 10K/10KH 10KH/10K CY100E474 100E474L-5KC 100E474L-7LC A301D

    c4744

    Abstract: 10E474-5K 10E474
    Text: CY10E474 CY100E474 CYPRESS : SEMICONDUCTOR • Features • 1024 x 4-bit organization • Ultra high speed/standard power — = 275 mA — I ce = 190 mA • Both 10KH/10K and 100K com patible I/O versions 10K/10KH M ilitary version • O n-chip voltage com pensation for


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K 10K/10KH 100E474 100Kcom 10E474L-5JC 10E474L-5K 10E474I 10E474L-5 c4744 10E474-5K 10E474

    ALC113

    Abstract: No abstract text available
    Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • On-chip voltage compensation for im­ proved noise margin • Open emitter output for ease of memory expansion • Industry-standard pinout Features • 1024 x 4-bit organization • Ultra high speed/standard power


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K CY100E474 CY100E474L-- ALC113

    CY7C2901

    Abstract: No abstract text available
    Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510


    OCR Scan     		PDF CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901

    Untitled

    Abstract: No abstract text available
    Text: CY10E474 CY100E474 CYPRESS: SEMICONDUCTOR 1024 x 4 ECL Static RAM Features • Open em itter output for ease of memory expansion • 1024 x 4-bit organization • Industry-standard pinout • Ultra high speed/standard power — t* = 3 ns, t*cs = 2 ns — IEE = 275 mA


    OCR Scan     		PDF CY10E474 CY100E474 CY10E474 10KH-/10K- BlocCY10E474-5LC CY10E474-5YC CY10E474-5KC CY10E474I

    CY100E474

    Abstract: CY10E474 E474 10E474-5 CY10E474L-5DC
    Text: CY10E474 CY100E474 IK x 4 ECL Static RAM SEMICONDUCTOR Features • On-chip voltage compensation for im­ proved noise margin • Open emitter output for ease of memory expansion • Industry-standard pinout • 1024 x 4-bit organization • Ultra high speed/standard power


    OCR Scan     		PDF CY10E474 CY100E474 10KH/10K- 100K-compat-ible 10KA0KH CY10E474Lâ 28-Lead E474 10E474-5 CY10E474L-5DC

    tc 89101 p

    Abstract: No abstract text available
    Text: CYPRESS SEMICONDUCTOR Features 1024x4 ECL Static RAM • On-chip voltage compensation for im­ proved noise margin • 1024 x 4 —bit organization • Ultra high speed/standard power • Open em itter output for ease o f memory expansion — Ia a = 3 -5 n s


    OCR Scan     		PDF CY10E474 CY100E474 1024x4 10E474 10KH/10K 100E474 10E474L--5JC 10E474L--7JC 10E474L--7K tc 89101 p