teradyne A360
Abstract: 1N4747 A360 LM6161 QR6161ENG ST K 3567
Text: Total-Dose Radiation Effects Characterization Engineering Evaluation Report for LM6161J/883 Final Rehan A. Zakai October 31, 1995 N TABLE OF CONTENTS I. INTRODUCTION. 1
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LM6161J/883
LM6161J/883
teradyne A360
1N4747
A360
LM6161
QR6161ENG
ST K 3567
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teradyne a565
Abstract: 1.6 volt zener diode teradyne A360 metal detector sensor digital metal detector metal detectors IC a360 airbag tester asic DATA SHEET 15 volt capacitor
Text: ASIC Technologies Allegro ASIC Business Unit • Supplier of ASICs and USICs to Industrial Market Leaders in: – Communications - SLICs, Telephone Terminals – Automotive - Airbag Monitor, ABS, Lamp Monitor, Fluid Monitor, Acceleration detector – Consumer
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20X22um
16X18um
teradyne a565
1.6 volt zener diode
teradyne A360
metal detector sensor
digital metal detector
metal detectors IC
a360
airbag tester
asic DATA SHEET
15 volt capacitor
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XBAR
Abstract: No abstract text available
Text: Status of Document is:RELEASED Effective from: 24-JAN-1996 09:44:39 to Date Printed: 09/03/97 6:34 AM 1.0 Controlled Document Purpose This specification outlines some minimum guidelines for characterization of new products prior to release to manufacturing. The data is required for product review during design release and
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24-JAN-1996
QOP0112
07-nov-1995
95QP1161
XBAR
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teradyne A360
Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455
Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO 9001 quality system is maintained, providing the necessary controls to assure that all product meets or exceeds the
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SEC450
SE1450/1455
SE3450/5450
SEP8505
SEP8506
SEP8507
teradyne A360
IRED
A360
SE1450
SE2460
SE3450
SE5450
SE1455
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SEP8703
Abstract: honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEC555 SEP8790 teradyne A360
Text: Reliability Summary of SEC555 AlGaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO9001 based quality system is maintained, providing the necessary
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SEC555
ISO9001
SE3470,
SEP8703
honeywell 940
Quantum Effect Devices
A360
SE3470
SE5470
SEP8790
teradyne A360
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HONEYWELL OPTOELECTRONICS
Abstract: HFE4023 "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352
Text: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip INTRODUCTION Honeywell Optoelectronics is committed to the manufacture of reliable, high quality optoelectronic products. A MIL-Q-9858 based quality system is maintained, providing the necessary controls to assure
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SEC589)
MIL-Q-9858
HFE4023
HLC3001
HONEYWELL OPTOELECTRONICS
"se-3352"
teradyne A360
HFE4003
C616C
HFE4000
sidelooker DIODE
HFE4020
se3352
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teradyne A360
Abstract: No abstract text available
Text: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium
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SEC450
SE1450
SE1470
SE3453/5453
SE3455/5455
SE34705470
SEP8505
SEP8705
SEP8506
teradyne A360
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teradyne A360
Abstract: No abstract text available
Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium
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SEC450
SEP8505
SEP8506
SEP8507
teradyne A360
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Untitled
Abstract: No abstract text available
Text: Reliability Summary of SEC555 AIGaAsrSi IRED Chip Long-Term Operating Life Study IRED CHIP DEGRADATION STUDIES MECHANICAL RELIABILITY Honeywell has an ongoing study ot degradation of radiant output over time as a function of temperature and current for the SEC555 aluminum gallium arsenide
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SEC555
SE3470,
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HFE4023
Abstract: No abstract text available
Text: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip ABSTRACT Honeywell Optoelectronics is conducting an ongoing study of degradation of radiant output over time as a function of temperature and current for the SEC589 "CAP ROCK” fiber optic, light emitting diode (LED) chip. This
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SEC589)
SEC589
SEC589
MIL-Q-9858
HFE4023
HLC3001
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triac tag 8518
Abstract: 70146 DS3654 X2864AD 7 segment display RL S5220 TC9160 la 4440 amplifier circuit diagram 300 watt philips ecg master replacement guide vtl 3829 A-C4 TCA965 equivalent
Text: 1985 0 / 0 / CONTENTS VOLUME I Introduction to IC MASTER 3 Advertisers’ Index 8 Master Selection Guide Function Index I0 Part Number Index 40 Part Number Guide 300 Logo Guide 346 Application Note Directory 349 Military Parts Directory 50I Testing 506 Cross Reference
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