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    TERADYNE A360 Search Results

    TERADYNE A360 Result Highlights (2)

    Part ECAD Model Manufacturer Description Download Buy
    OPA360AIDCKR Texas Instruments 3V, Video Amplifier with Low Pass Filter, Internal G=2 and SAG Correction in SC70 6-SC70 -40 to 85 Visit Texas Instruments Buy
    OPA360AIDCKT Texas Instruments 3V, Video Amplifier with Low Pass Filter, Internal G=2 and SAG Correction in SC70 6-SC70 -40 to 85 Visit Texas Instruments Buy

    TERADYNE A360 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    teradyne A360

    Abstract: 1N4747 A360 LM6161 QR6161ENG ST K 3567
    Text: Total-Dose Radiation Effects Characterization Engineering Evaluation Report for LM6161J/883 Final Rehan A. Zakai October 31, 1995 N TABLE OF CONTENTS I. INTRODUCTION. 1


    Original     		PDF LM6161J/883 LM6161J/883 teradyne A360 1N4747 A360 LM6161 QR6161ENG ST K 3567

    teradyne a565

    Abstract: 1.6 volt zener diode teradyne A360 metal detector sensor digital metal detector metal detectors IC a360 airbag tester asic DATA SHEET 15 volt capacitor
    Text: ASIC Technologies Allegro ASIC Business Unit • Supplier of ASICs and USICs to Industrial Market Leaders in: – Communications - SLICs, Telephone Terminals – Automotive - Airbag Monitor, ABS, Lamp Monitor, Fluid Monitor, Acceleration detector – Consumer


    Original     		PDF 20X22um 16X18um teradyne a565 1.6 volt zener diode teradyne A360 metal detector sensor digital metal detector metal detectors IC a360 airbag tester asic DATA SHEET 15 volt capacitor

    XBAR

    Abstract: No abstract text available
    Text: Status of Document is:RELEASED Effective from: 24-JAN-1996 09:44:39 to Date Printed: 09/03/97 6:34 AM 1.0 Controlled Document Purpose This specification outlines some minimum guidelines for characterization of new products prior to release to manufacturing. The data is required for product review during design release and


    Original     		PDF 24-JAN-1996 QOP0112 07-nov-1995 95QP1161 XBAR

    teradyne A360

    Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455
    Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO 9001 quality system is maintained, providing the necessary controls to assure that all product meets or exceeds the


    Original     		PDF SEC450 SE1450/1455 SE3450/5450 SEP8505 SEP8506 SEP8507 teradyne A360 IRED A360 SE1450 SE2460 SE3450 SE5450 SE1455

    SEP8703

    Abstract: honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEC555 SEP8790 teradyne A360
    Text: Reliability Summary of SEC555 AlGaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO9001 based quality system is maintained, providing the necessary


    Original     		PDF SEC555 ISO9001 SE3470, SEP8703 honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEP8790 teradyne A360

    HONEYWELL OPTOELECTRONICS

    Abstract: HFE4023 "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352
    Text: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip INTRODUCTION Honeywell Optoelectronics is committed to the manufacture of reliable, high quality optoelectronic products. A MIL-Q-9858 based quality system is maintained, providing the necessary controls to assure


    Original     		PDF SEC589) MIL-Q-9858 HFE4023 HLC3001 HONEYWELL OPTOELECTRONICS "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352

    teradyne A360

    Abstract: No abstract text available
    Text: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		PDF SEC450 SE1450 SE1470 SE3453/5453 SE3455/5455 SE34705470 SEP8505 SEP8705 SEP8506 teradyne A360

    teradyne A360

    Abstract: No abstract text available
    Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		PDF SEC450 SEP8505 SEP8506 SEP8507 teradyne A360

    Untitled

    Abstract: No abstract text available
    Text: Reliability Summary of SEC555 AIGaAsrSi IRED Chip Long-Term Operating Life Study IRED CHIP DEGRADATION STUDIES MECHANICAL RELIABILITY Honeywell has an ongoing study ot degradation of radiant output over time as a function of temperature and current for the SEC555 aluminum gallium arsenide


    OCR Scan     		PDF SEC555 SE3470,

    HFE4023

    Abstract: No abstract text available
    Text: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip ABSTRACT Honeywell Optoelectronics is conducting an ongoing study of degradation of radiant output over time as a function of temperature and current for the SEC589 "CAP ROCK” fiber optic, light emitting diode (LED) chip. This


    OCR Scan     		PDF SEC589) SEC589 SEC589 MIL-Q-9858 HFE4023 HLC3001

    triac tag 8518

    Abstract: 70146 DS3654 X2864AD 7 segment display RL S5220 TC9160 la 4440 amplifier circuit diagram 300 watt philips ecg master replacement guide vtl 3829 A-C4 TCA965 equivalent
    Text: 1985 0 / 0 / CONTENTS VOLUME I Introduction to IC MASTER 3 Advertisers’ Index 8 Master Selection Guide Function Index I0 Part Number Index 40 Part Number Guide 300 Logo Guide 346 Application Note Directory 349 Military Parts Directory 50I Testing 506 Cross Reference


    OCR Scan     		PDF