27C1024

Abstract: MIL-M-38535 2C9237 4B942 3B93
Contextual Info: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT

rau2

Abstract: 1A011
Contextual Info: HY5116160 Series -HYUNDAI 1M X 16-bit CMOS DRAM with 2CAS DESCRIPTION The HY5116160 is the new generation and fast dynamic RAM organized 1,048,576 x 16-bit. The HY5116160 utilizes Hyundai's CMOS silicon gate process technology as well as advanced circuit techniques to provide wide

Contextual Info: «HYUNDAI HY5116160 Series 1Mx 16-bit CMOS DRAM with 2CAS DESCRIPTION The HY5116160 is the new generation and fast dynamic RAM organized 1,048,576 x 16-bit. The HY5116160 utilizes Hyundai's CMOS silicon gate process technology as well as advanced circuit techniques to provide wide

TSOP 173 g

Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT

Contextual Info: LINEAR 1C 8-Bit D/A Converter with Operational Amplifier Output Buffers M B88344/88344B • DESCRIPTION MB88344/MB88344B are 8-bit 36 channels D/A converters which have two reference voltages to use 36 channels as 12 channels and 24 channels independently.

Contextual Info: Freescale Semiconductor Advance Information Document Number: MC07XS3200 Rev. 3.0, 9/2014 Dual High-side Switch 7.0 mOhm 07XS3200 The 07XS3200 is one in a family of SMARTMOS devices designed for lowvoltage automotive lighting applications. Its two low RDS(on) MOSFETs (dual

sumitomo epoxy 6600

Abstract: sumitomo epoxy 1143 at27c256 data retention AT29LV020 sumitomo silver epoxy 28BV256 0c002 ATMEL AT27lv256 AT49*512 AT28C256
Contextual Info: Parallel EEPROM 256Kbit Qualification Summary § Component Design & Construction Description § Test Summary Oper Life Test Data Retention Endurance Rel Humidity Autoclave Temp Cycle ESD Latch-up Electrical Dist./Char. available per request Plastic Package (TSOP, SOIC, PLCC)

Contextual Info: Freescale Semiconductor Advance Information Document Number: MC07XSC200 Rev. 2.0, 9/2013 Dual High Side Switch 7.0 mOhm 07XSC200 The 07XSC200 is one in a family of devices designed for low-voltage lighting or factory automation applications. Its two low RDS(ON)

TSOP 54 Package

Abstract: 27bv010 report on PLCC 6A17 MIL-M-38535 5A9530 7C9745 8b99
Contextual Info: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV010 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - EXTENDED THERMAL SHOCK - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST

Contextual Info: Freescale Semiconductor Advance Information Document Number: MC07XS3200 Rev. 2.0, 6/2013 Dual High Side Switch 7.0 mOhm 07XS3200 The 07XS3200 is one in a family of devices designed for low-voltage automotive lighting applications. Its two low RDS(ON) MOSFETs (dual